E
E. Boole
Researcher at Helsinki University of Technology
Publications - 6
Citations - 44
E. Boole is an academic researcher from Helsinki University of Technology. The author has contributed to research in topics: Sampling (signal processing) & Nonuniform sampling. The author has an hindex of 3, co-authored 6 publications receiving 44 citations.
Papers
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Proceedings ArticleDOI
Optimal sampling functions in nonuniform sampling driver designs to overcome the Nyquist limit
TL;DR: In this paper the authors discuss a nonuniform sampling scheme that is especially suited to be implemented in digital devices, thus, fully exploiting state-of-the-art ADC without violating their specifications.
Proceedings ArticleDOI
Nonuniform sampling driver design for optimal ADC utilization
TL;DR: This is the first proposal of an efficient nonuniform sampling driver (SD) design in the open literature and promises increased equivalent sampling rates with reduced overall hardware costs of the DSP system.
Journal Article
Potential of the DSP-based Method for Fast Precise Event Timing
TL;DR: General principles of high-precision event timing based on DSP approach are discussed and it is shown that the method can provide picosecond precision at measurement rate up to tens of MHz.
Journal Article
Digital Synchronous Demodulator for Measurement of Complex Amplitude Deviation
Yu. Artyukh,E. Boole,V. Vedin +2 more
TL;DR: In this article, a considered demodulator uses periodic rectangular functions instead of conventional sinusoidal ones for calculation of Fourier coefficients defining complex amplitude, which allows considerable simplifying the demodulators design and increasing its operation speed.
Proceedings ArticleDOI
Determination of correction function for reducing integral non-linearity of DSP-based event timer
Yu. Artyukh,E. Boole,J. Bule +2 more
TL;DR: Suggested approach to resolving this problem is based on determination of a correction function using constant period test pulse sequences with seemingly random modular values, and it is shown that such an approach allows achieving non-linearity correction with picosecond precision at test pulse sequence lengths quite acceptable for practical applications.