The problem considered is the diagnosis of failures of automata, specifically, failures that manifest themselves as logical malfunctions. A review of previous methods and results is first given. A method termed the "calculus of D-cubes" is then introduced, which allows one to describe and compute the behavior of failing acyclic automata, both internally and externally. An algorithm, called the D-algorithm, is then developed which utilizes this calculus to compute tests to detect failures. First a manual method is presented, by means of an example. Thence, the D-algorithm is precisely described by means of a program written in Iverson notation. Finally, it is shown for the acyclic case in which the automaton is constructed from AND'S, NAND'S, OR'S and NOR'S that if a test exists, the D-algorithm will compute such a test.

Diagnosis of automata failures: a calculus and a method

Two algorithms are presented: one, DALG-II, computes a test to detect a failure in acyclic logic circuits; the other, TEST-DETECT, ascertains all failures detected by a given test. Both are based upon the utilization of a ``calculus of D-cubes'' that provides the means for effectively performing the necessary computations for very large logic circuits. Strategies for combining the two algorithms into an efficient diagnostic test generation procedure are given. APL specifications of the algorithms are given in an Appendix.

Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits

—he problem of designing test schedules for the testing or diagnosis of a small number of nontransient faults in combinational digital circuits (switching networks) is considered in detail. By testing and diagnosis we mean the following: 1) detection of a fault, 2) location of a fault, and 3) location of a fault within the confines of a prescribed package or module. It is shown that minimal test schedules can be readily derived–using procedures already worked out for solving certain problems in pattern recognition and switching theory–under the assumption that the selection of the test inputs in the schedule is independent of the response of the circuit under test. When this assumption is not made, it is shown that much shorter test schedules are sometimes possible, and procedures are offered for obtaining good ones. Finally, the general status of diagnostics for digital circuits is reviewed and evaluated, and specific problems remaining to be solved are described.

Fault Testing and Diagnosis in Combinational Digital Circuits

Electronic Design Automation for Integrated Circuits Handbook

Throughout its history, from the early four-circuit gate-array chips of the late 1960s to today's billion-transistor multichip module, IBM has invested in tools to support its leading-edge technology and high-performance product development. The combination of demanding designs and close cooperation among product, technology, and tool development has given rise to many innovations in the electronic design automation (EDA) area and provided IBM with a significant competitive advantage. This paper highlights IBM's contributions over the last four decades and presents a view of the future, where the best methods of multimillion gate ASIC and gigahertz microprocessor design are converged to enable highly productive system-on-a-chip designs that include widely diverse hardware and software components.

http://files.vlsi.uwindsor.ca/88-559/page6/files/eda_at_ibm_tcad2000.pdf

EDA in IBM: past, present, and future

This paper describes an approach to the maintenance problem of central processors which minimizes the human role. This approach consists of a combination of 1) a programming system which computes the diagnostic program from the design-automation tape, and 2) a novel organization of a part of the controls of an experimental computer. Problems which require solution are listed and reasons are given as to why they were solved by the methods described. An account of the programming system and hardware as implemented is given, and improvements in them are considered in the light of difficulties encountered.

E. L. Allen

Papers

A Computer Organization and Programming System for Automated Maintenance