Journal ArticleDOI
A Computer Organization and Programming System for Automated Maintenance
K. Maling,E. L. Allen +1 more
TLDR
An approach to the maintenance problem of central processors which minimizes the human role is described, consisting of a programming system which computes the diagnostic program from the design-automation tape, and a novel organization of a part of the controls of an experimental computer.Abstract:
This paper describes an approach to the maintenance problem of central processors which minimizes the human role. This approach consists of a combination of 1) a programming system which computes the diagnostic program from the design-automation tape, and 2) a novel organization of a part of the controls of an experimental computer. Problems which require solution are listed and reasons are given as to why they were solved by the methods described. An account of the programming system and hardware as implemented is given, and improvements in them are considered in the light of difficulties encountered.read more
Citations
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Journal ArticleDOI
Diagnosis of automata failures: a calculus and a method
TL;DR: The problem considered is the diagnosis of failures of automata, specifically, failures that manifest themselves as logical malfunctions, and an algorithm is developed which utilizes this calculus to compute tests to detect failures.
Journal ArticleDOI
Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits
TL;DR: Two algorithms are presented: one, DALG-II, computes a test to detect a failure in acyclic logic circuits; the other, TEST-DETECT, ascertains all failures detected by a given test.
Journal ArticleDOI
Fault Testing and Diagnosis in Combinational Digital Circuits
TL;DR: The problem of designing test schedules for the testing or diagnosis of a small number of nontransient faults in combinational digital circuits (switching networks) is considered in detail and minimal test schedules can be readily derived.
Journal ArticleDOI
EDA in IBM: past, present, and future
John A. Darringer,Edward S. Davidson,David J. Hathaway,B. Koenemann,Mark A. Lavin,J.K. Morrell,K. Rahmat,Wolfgang Roesner,E. Schanzenbach,Gustavo E. Tellez,Louise H. Trevillyan +10 more
TL;DR: A view of the future is presented, where the best methods of multimillion gate ASIC and gigahertz microprocessor design are converged to enable highly productive system-on-a-chip designs that include widely diverse hardware and software components.
References
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Journal ArticleDOI
The Diagnosis of Asynchronous Sequential Switching Systems
S. Seshu,D. N. Freeman +1 more
TL;DR: This paper considers the problem of automatically testing a sequential switching circuit and writes a program to be generated by an IBM 7090 computer from the logical description of the circuit to be tested.
Proceedings ArticleDOI
Test routines based on symbolic logical statements
TL;DR: A method for selecting the minimum number of test conditions necessary to determine whether all tubes and diodes within a gating struction are operating properly is presented here.
Proceedings ArticleDOI
Techniques for the diagnosis of switching circuit failures
TL;DR: In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred.