Eberhard Manske

TL;DR: In this article, a range of nanoprobe systems usable in nanomeasuring machines is discussed, such as optical focus sensors, white light interferometer microscopes, CCD camera microscopes using the depth from the focus method, tactile stylus probes, atomic force microscopes (AFMs) and 3D microprobes.

TL;DR: The performance of low and high-crystallized MoS2 is compared to show the function of crystallinity is dependent on the electrochemical mechanism, and is one of the best among the reported LS-TMDs in KIBs.

TL;DR: In this article, an advanced phase meter was developed at PTB to resolve displacements of a picometer with widely used commercially available heterodyne interferometers, which is capable of interpolating an optical fringe down into the picometer regime.

TL;DR: In this article, a new nanopositioning and nanomeasuring machine NPMM-200 with a measuring range of 200mm × 200 mm × 25 mm, and a resolution of 0.02 nm was developed.

TL;DR: In this article, the authors describe traceable nanometrology based on a nanopositioning machine with integrated nanoprobes, which is used for various tasks, such as large area scanning probe microscopy, mask and wafer inspection, nanostructuring, biotechnology and genetic engineering as well as measuring mechanical precision workpieces, precision treatment and for engineering new material.