E
Eleni Pavlopoulou
Researcher at University of Bordeaux
Publications - 40
Citations - 765
Eleni Pavlopoulou is an academic researcher from University of Bordeaux. The author has contributed to research in topics: Thin film & Conductive polymer. The author has an hindex of 15, co-authored 34 publications receiving 604 citations. Previous affiliations of Eleni Pavlopoulou include Centre national de la recherche scientifique & Aristotle University of Thessaloniki.
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Journal ArticleDOI
Block Copolymer as a Nanostructuring Agent for High‐Efficiency and Annealing‐Free Bulk Heterojunction Organic Solar Cells
Cedric Renaud,Sébastien Jun Mougnier,Eleni Pavlopoulou,Cyril Brochon,Guillaume Fleury,Dargie Hailu Deribew,Giuseppe Portale,Eric Cloutet,Sylvain Chambon,Laurence Vignau,Georges Hadziioannou +10 more
TL;DR: A significant enhancement of the cell efficiency is observed, in correlation with morphology control, both before (as-cast) and after the annealing process.
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Correlating the Seebeck coefficient of thermoelectric polymer thin films to their charge transport mechanism
Ioannis Petsagkourakis,Eleni Pavlopoulou,Eric Cloutet,Yan Fang Chen,Xjianjie Liu,Mats Fahlman,Magnus Berggren,Xavier Crispin,Stefan Dilhaire,Guillaume Fleury,Georges Hadziioannou +10 more
TL;DR: In this article, the authors investigated the dependence of Seebeck coefficient on charge carrier mobility for the first time in organic electronics and reported a concurrent increase of S and σ and experimentally derived the dependence on seebeck coefficient.
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Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films
Ioannis Petsagkourakis,Eleni Pavlopoulou,Giuseppe Portale,Bryan A Kuropatwa,Stefan Dilhaire,Guillaume Fleury,Georges Hadziioannou +6 more
TL;DR: Probing the thin film structure by Grazing Incidence Wide Angle X-ray Scattering has shown that this behavior is dictated by the structural properties of the PEDOT:Tos films; specifically by thethin film crystallinity combined to the preferential edge-on orientation of thePEDOT crystallites.
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Mueller matrix spectroscopic ellipsometry: formulation and application
TL;DR: In this article, the Mueller matrix spectroscopic ellipsometry (MMSE) was used for the analysis of an isotropic c-Si wafer and the ability of the formulation to calculate correctly its dielectric function using the M 33 and M 43 components in the energy region 1.5-6.5 eV.
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Tuning the morphology of all-polymer OPVS through altering polymer-solvent interactions
Eleni Pavlopoulou,Chang Su Kim,Stephanie S. Lee,Zhihua Chen,Antonio Facchetti,Michael F. Toney,Yueh-Lin Loo +6 more
TL;DR: In this paper, the effects of solvent(s) interactions on the morphology of all-polymer bulk-heterojunction (BHJ) active layers cast from cosolutions were investigated.