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Stefan Dilhaire

Researcher at University of Bordeaux

Publications -  159
Citations -  2819

Stefan Dilhaire is an academic researcher from University of Bordeaux. The author has contributed to research in topics: Laser & Integrated circuit. The author has an hindex of 27, co-authored 150 publications receiving 2586 citations. Previous affiliations of Stefan Dilhaire include Centre national de la recherche scientifique.

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Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers

TL;DR: By engineering a set of individual phonon-scattering nanodot barriers, this work accurately tailored the thermal conductivity of a single-crystalline SiGe material in spatially defined regions as short as approximately 15 nm, resulting in a room-temperature kappa well below the amorphous limit.
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Thermal properties of carbon fibers at very high temperature

TL;DR: In this paper, the experimental thermal conductivity estimated by the indirect relation \lambda = a\rhoC_p is presented as a function of the temperature, and the influence of heat treatment on the thermal conductivities of carbon fibers is also described.
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Scanning thermal microscopy of individual silicon nanowires

TL;DR: In this paper, a thermal model for the scanning thermal microscopy (SThM) probe is presented with two steps: a model out of contact which enables a calibration of the probe, and a model in contact to extract thermal parameters from the sample under study.
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Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses.

TL;DR: Experimental and calculational results demonstrate the thermoelastic generation of shear acoustic waves using femtosecond laser pulses in submicrometric isotropic aluminum films and shows that the generation of the shear waves is correlated to the reduction of the width of the optoacoustic source on the surface.
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Thermal coupling in integrated circuits: application to thermal testing

TL;DR: In this paper, dynamic and spatial thermal behavioral characterization of VLSI MOS devices is presented using laser thermoreflectance measurements and on-chip differential temperature sensing circuits.