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Elizabeth M. Rudnick
Researcher at University of Illinois at Urbana–Champaign
Publications - 51
Citations - 1973
Elizabeth M. Rudnick is an academic researcher from University of Illinois at Urbana–Champaign. The author has contributed to research in topics: Sequential logic & Fault coverage. The author has an hindex of 28, co-authored 51 publications receiving 1957 citations.
Papers
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Proceedings ArticleDOI
Sequential circuit test generation using dynamic state traversal
TL;DR: A new method for state justification is proposed for sequential circuit test generation, using the linear list of states dynamically obtained during the derivation of test vectors to guide the search during state justification.
Proceedings ArticleDOI
Sequential Circuit Test Generation in a Genetic Algorithm Framework
TL;DR: A genetic algorithm (GA) framework for sequential circuit test generation that evolves candidate test vectors and sequences, using a fault simulator to compute the fitness of each candidate test.
Book
Genetic Algorithms for Vlsi Design, Layout & Test Automation
TL;DR: This book provides details about some of the EDA applications where GAs have been used, including partitioning, automatic placement and routing, technology mapping for FPGAs, automatic test generation, and power estimation.
Journal ArticleDOI
A gate-level simulation environment for alpha-particle-induced transient faults
TL;DR: A gate-level transient fault simulation environment which has been developed based on realistic fault models and can be used for any transient fault which can be modeled as a transient pulse of some width is described.
Journal ArticleDOI
A genetic algorithm framework for test generation
TL;DR: High fault coverages were obtained for most of the ISCAS'89 sequential benchmark circuits, and execution times were significantly lower than in a deterministic test generator in most cases.