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Emmanuel Lanzmann
Researcher at Katholieke Universiteit Leuven
Publications - 7
Citations - 129
Emmanuel Lanzmann is an academic researcher from Katholieke Universiteit Leuven. The author has contributed to research in topics: Wavefront & Wavefront sensor. The author has an hindex of 4, co-authored 7 publications receiving 124 citations.
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Patent
Spatial wavefront analysis and 3d measurement
Yoel Arieli,Shay Wolfling,David Banitt,Yosi Weitzman,Yoram Saban,Emmanuel Lanzmann,Shay Levavi +6 more
TL;DR: In this paper, a method of wavefront analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114, 114) to the transformed wavefront (108), obtaining the plurality of intensity maps (130, 132, 134, 134) wherein the plurality is applied to region of the transformed Wavefront, corresponding to a shape of the light source.
Patent
Methods and apparatus for wavefront manipulations and improved 3-d measurements
TL;DR: In this article, the phase and surface topography measurements by wavefront propagation and refocusing, using virtual wave front propagation based on solutions of Maxwell's equations are described, and applied to Integrated Circuit inspection, to improve overlay measurement techniques, by improving contrast or by 3D imaging, in single shot imaging.
Journal ArticleDOI
Spatial phase-shift interferometry—a wavefront analysis technique for three-dimensional topometry
TL;DR: A new wavefront analysis method is described, in which certain wavefront manipulations are applied to a spatially defined area in a certain plane along the optical axis, making this method a spatial phase-shift interferometry method.
Journal ArticleDOI
Wavefront reconstruction by spatial-phase-shift imaging interferometry
TL;DR: The spatial-phase-shift imaging interferometry technique for surface measurements and wavefront analysis in which different parts of the wavefront undergo certain manipulations in a certain plane along the optical axis replaces the reference-beam phase shifting of existing interferometers.
Patent
Improved spatial wavefront analysis and 3d measurement
Yoel Arieli,Shay Wolfling,David Banitt,Yosi Weitzman,Yoram Saban,Emmanuel Lanzmann,Shay Levavi +6 more
TL;DR: In this article, a method of wavefront analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114, 114) to the transformed wavefront (108), obtaining the plurality of intensity maps (130, 132, 134, 134) wherein the plurality is applied to region of the transformed Wavefront, corresponding to a shape of the light source.