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Erdal Oruklu

Researcher at Illinois Institute of Technology

Publications -  138
Citations -  1234

Erdal Oruklu is an academic researcher from Illinois Institute of Technology. The author has contributed to research in topics: Signal processing & Field-programmable gate array. The author has an hindex of 18, co-authored 135 publications receiving 1079 citations.

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Proceedings ArticleDOI

Ultrasonic flaw detection using Hidden Markov Model with wavelet features

TL;DR: Experimental results show that flaws can be detected even in signals with very low signal to noise ratio, compared to other regression methods such as Support Vector Regression, HMM performs better and requires less effort and A-scan data for training.
Journal ArticleDOI

Security Policy Management Process within Six Sigma Framework

TL;DR: The security policy creation and management process proposed in this paper is based on the Six Sigma model and presents a method to adapt security goals and risk management of a computing service.
Proceedings ArticleDOI

Adaptive 3D ultrasonic data compression using distributed processing engines

TL;DR: A fast and scalable data compression System-on-Chip (SoC) architecture based on Discrete Wavelet Transform (DWT) is proposed that can process A-Scan, B-Scan and C-Scan signals and images in real-time and reduce the data and bandwidth requirements substantially without degrading the signal fidelity.
Proceedings ArticleDOI

A high-level synthesis and verification tool for fixed to floating point conversion

TL;DR: A flexible and efficient fixed to floating point conversion tool is presented for digital signal processing and communication systems that can increase productivity by reducing the design and verification time.
Proceedings ArticleDOI

Unsupervised Machine Learning for Ultrasonic Flaw Detection using Gaussian Mixture Modeling, K-Means Clustering and Mean Shift Clustering

TL;DR: Three different UML algorithms based on K-means clustering, Gaussian Mixture Modeling and Mean Shift Clustering are used in order to detect and locate flaw echoes in ultrasonic A-Scan data.