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Erdal Oruklu

Researcher at Illinois Institute of Technology

Publications -  138
Citations -  1234

Erdal Oruklu is an academic researcher from Illinois Institute of Technology. The author has contributed to research in topics: Signal processing & Field-programmable gate array. The author has an hindex of 18, co-authored 135 publications receiving 1079 citations.

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Journal ArticleDOI

Hardware/Software Co-Design of a Traffic Sign Recognition System Using Zynq FPGAs

TL;DR: A traffic sign detection system based on color segmentation, speeded-up robust features (SURF) detection and the k-nearest neighbor classifier is introduced, which benefits from the SURF detection algorithm, which achieves invariance to rotated, skewed and occluded signs.
Proceedings ArticleDOI

Design and Synthesis of a Carry-Free Signed-Digit Decimal Adder

TL;DR: Results show that proposed adder architecture improves the area-delay factor by 3 for a 32 digit adder, compared to the existing decimal adders with respect to design area, delay and power consumption.
Proceedings ArticleDOI

A Multi-Resolution Convolutional Neural Network Architecture for Ultrasonic Flaw Detection

TL;DR: Two CNN architectures are proposed (based on ID-CNN and LeNet models) for ultrasonic data (A-scan) using wavelet coefficients as feature inputs and investigate key topologies such as number of parallel convolution networks, number of filters and output classifiers.
Proceedings ArticleDOI

Fast memory addressing scheme for radix-4 FFT implementation

TL;DR: An efficient addressing scheme for radix-4 FFT processor that avoids the modulo-r addition in the address generation and the critical path is independent from the FFT transform length N, making it extremely efficient for large FFT transforms.
Proceedings ArticleDOI

Ultrasonic flaw detection using Support Vector Machine classification

TL;DR: A Support Vector Machine (SVM) classifier is introduced for ultrasonic flaw detection based on features extracted from the output of the subband decomposition filters and results show that a very high classification accuracy can be achieved.