E
Ernest Bassous
Researcher at IBM
Publications - 31
Citations - 719
Ernest Bassous is an academic researcher from IBM. The author has contributed to research in topics: Silicon & Layer (electronics). The author has an hindex of 15, co-authored 31 publications receiving 719 citations.
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Patent
Ink jet nozzle
TL;DR: In an ink jet printing system, a single nozzle or an array of nozzles are etched in a semiconductor material such as silicon as discussed by the authors, each nozzle has polygonal or N-sided entrance and exit apertures of different cross-sectional area.
Patent
Jet nozzle structure for electrohydrodynamic droplet formation and ink jet printing system therewith
TL;DR: In this article, the authors present a monolithic structure for electrohydrodynamically synchronizing the formation of droplets in a jet stream exiting from a jet nozzle, which is primarily adaptable for ink jet printing.
Patent
Mirror array light valve
TL;DR: In this paper, a mirror array light valve is described, comprising a transparent substrate, a plurality of post members arranged in a regular array on the substrate, and a number of deflectable square, rectangular, hexagonal or like light-reflecting elements arranged on the post members such that a post member is positioned under a corresponding corner of each element.
Patent
High speed silicon-based lateral junction photodetectors having recessed electrodes and thick oxide to reduce fringing fields
Ernest Bassous,Jean-Marc Halbout,Subramanian S. Iyer,Rajiv V. Joshi,V. P. Kesan,Michael R. Scheuermann,Massimo A. Ghioni +6 more
TL;DR: In this paper, a metal-semiconductor-metal photodetector (MSM-PD) or a lateral p-i-n photodeter (LPIN-PD), is disclosed embodying interdigitated metallic electrodes on a silicon surface.
Patent
Gray scale etching for thin flexible interposer
Ernest Bassous,Gobinda Das,Frank D. Egitto,Natalie B. Feilchenfeld,Elizabeth Foster,Stephen Joseph Fuerniss,James Steven Kamperman,Donald Joseph Mikalsen,Michael R. Scheuermann,David B. Stone +9 more
TL;DR: In this article, a sculpted probe pad and a gray scale etching process for making arrays of such probe pads on a thin flexible interposer for testing the electrical integrity of microelectronic devices at terminal metallurgy are described.