A 1.8-V 14-b 12-MS/s pseudo-differential pipeline analog-to-digital converter (ADC) using a passive capacitor error-averaging technique and a nested CMOS gain-boosting technique is described. The converter is optimized for low-voltage low-power applications by applying an optimum stage-scaling algorithm at the architectural level and an opamp and comparator sharing technique at the circuit level. Prototyped in a 0.18-/spl mu/m 6M-1P CMOS process, this converter achieves a peak signal-to-noise plus distortion ratio (SNDR) of 75.5 dB and a 103-dB spurious-free dynamic range (SFDR) without trimming, calibration, or dithering. With a 1-MHz analog input, the maximum differential nonlinearity is 0.47 LSB and the maximum integral nonlinearity is 0.54 LSB. The large analog bandwidth of the front-end sample-and-hold circuit is achieved using bootstrapped thin-oxide transistors as switches, resulting in an SFDR of 97 dB when a 40-MHz full-scale input is digitized. The ADC occupies an active area of 10 mm/sup 2/ and dissipates 98 mW.

A 14-b 12-MS/s CMOS pipeline ADC with over 100-dB SFDR

The design of an analog-to-digital converter or digital-to-analog converter is one of the most fascinating tasks in micro-electronics. In a converter the analog world with all its intricacies meets the realm of the formal digital abstraction. Both disciplines must be understood for an optimum conversion solution. In a converter also system challenges meet technology opportunities. Modern systems rely on analog-to-digital converters as an essential part of the complex chain to access the physical world. And processors need the ultimate performance of digital-to-analog converters to present the results of their complex algorithms. The same progress in CMOS technology that enables these VLSI digital systems creates new challenges for analog-to-digital converters: lower signal swings, less power and variability issues. Last but not least, the analog-to-digital converter must follow the cost reduction trend. These changing boundary conditions require micro-electronics engineers to consider their design choices for every new design. Analog-to-Digital Conversion discusses the different analog-to-digital conversion principles: sampling, quantization, reference generation, nyquist architectures and sigma-delta modulation. Analog-to-Digital Conversion presents an overview of the state-of-the-art in this field and focuses on issues of optimizing accuracy and speed while reducing the power level. A lot of background knowledge and practical tips complement the discussion of basic principles, which makes Analog-to-Digital Conversion also a reference for the experienced engineer.

Analog-to-Digital Conversion

The residue amplifiers in high-speed pipelined analog-to-digital converters (ADCs) typically determine the converter's overall speed and power performance. We propose a mixed-signal technique that exploits incomplete settling to achieve low power residue amplification. In the first stage of a 12-bit, 75-MS/s proof-of-concept prototype, the employed open-loop residue amplifier dissipates only 2.9 mW from a 3-V supply, achieving >60% amplifier power reduction over a previously reported open-loop residue amplifier implementation and achieving >90% amplifier power reduction over a conventional opamp implementation. Test results show that the converter's maximum signal-to-noise-and-distortion ratio (SNDR) is 65.6 dB. The measured integral and differential nonlinearity are 0.95 LSB and 0.64 LSB, respectively. The experimental chip occupies 7.9 mm2 and consumes 273 mW in a 0.35-mum double-poly, quadruple-metal CMOS process

A 12-Bit 75-MS/s Pipelined ADC Using Incomplete Settling

A 1-V, 8-bit pipelined ADC is realized using multi-phase switched-opamp (SO) technique. A novel loading-free architecture is proposed to reduce the capacitive loading and to improve the speed in low-voltage SO circuits. Employing the proposed loading-free pipelined ADC architecture together with double-sampling technique and a fast-wake-up dual-input-dual-output switchable opamp, the ADC achieves 100-MS/s conversion rate, which to our knowledge is the fastest ADC ever reported at 1-V supply using SO technique, with performance comparable to that of many high-voltage switched-capacitor (SC) ADCs. Implemented in a 0.18-mum CMOS process, the ADC obtains a peak SNR of 45.2 dB, SNDR of 41.5 dB, and SFDR of 52.6 dB. Measured DNL and INL are 0.5 LSB and 1.1 LSB, respectively. The chip dissipates only 30 mW from a 1-V supply

A 1-V 100-MS/s 8-bit CMOS Switched-Opamp Pipelined ADC Using Loading-Free Architecture

A low-power 14-b 100-MS/s analog-to-digital converter (ADC) is described. The prototype ADC achieves low-power consumption and small die area by sharing an opamp between two successive pipeline stages. Further reduction of power and area is achieved by completely merging the front-end sample-and-hold amplifier (SHA) into the first multiplying digital-to-analog converter (MDAC) using the proposed opamp and capacitor sharing technique. The ADC, implemented in a 0.18-mum dual-gate-oxide (DGO) CMOS technology, achieves 72.4-dB signal-to-noise and distortion ratio, 88.5-dB spurious free dynamic range, and 11.7 effective number of bits at full sampling rate with a 46-MHz input while consuming 230-mW from a 3-V supply.

A 14-b 100-MS/s Pipelined ADC With a Merged SHA and First MDAC

A 10-bit 80-MS/s analog-to-digital converter (ADC) with an area- and power-efficient architecture is described. By sharing an amplifier between two successive pipeline stages, a 10-bit pipeline is realized using just four amplifiers with a separate sample-and-hold block. The proposed feedback signal polarity inverting (FSPI) technique addresses the drawback of the conventional amplifier sharing technique. A wide-swing wide-bandwidth telescopic amplifier and an early comparison technique with a constant delay circuit have been developed to further reduce power consumption. The ADC is implemented in a 0.18-/spl mu/m dual-gate-oxidation CMOS process technology, achieves 72.8-dBc spurious free dynamic range, 57.92-dBc signal-to-noise ratio, 9.29 effective number of bits (ENOB) for a 99-MHz input at full sampling rate, and consumes 69 mW from a 3-V supply. The ADC occupies 1.85 mm/sup 2/.

F.W. Bowman

Papers

A 69-mW 10-bit 80-MSample/s Pipelined CMOS ADC