F
Faik Baskaya
Researcher at Boğaziçi University
Publications - 28
Citations - 363
Faik Baskaya is an academic researcher from Boğaziçi University. The author has contributed to research in topics: Field-programmable analog array & Analogue electronics. The author has an hindex of 10, co-authored 28 publications receiving 336 citations. Previous affiliations of Faik Baskaya include Georgia Institute of Technology.
Papers
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Journal ArticleDOI
An analog circuit synthesis tool based on efficient and reliable yield estimation
TL;DR: A novel yield-aware analog circuit sizing tool, where an adaptive sample sizing algorithm for scrambled-QMC is employed in the yield estimation part, to overcome the major bottleneck of the conventional QMC.
Journal ArticleDOI
Design, implementation, and evaluation of a backstepping control algorithm for an active ankle–foot orthosis
TL;DR: An adaptive backstepping control algorithm is proposed for tracking desired gait trajectories while reducing the effects of unknown disturbances and an embedded system is designed to bring portability to the ankle–foot orthosis prototype.
Proceedings ArticleDOI
Design of a digitally tunable 5 th order GM-C filter using linearized OTA in 90nm CMOS technology
TL;DR: In this article, an analog 5th-order GM-S low-pass filter structure using ten identical operational transconductance amplifiers (OTA) for high speed wireless systems was designed, which can be tuned by a single bias current, which is provided by a 5-bit current DAC.
Proceedings ArticleDOI
Sensitivity based methodologies for process variation aware analog IC optimization
TL;DR: In this article, two different methodologies are proposed and discussed for variation aware design automation of analog circuits: over-design approach that is based on guard-banding the circuit performance and variance-aware design approach depending on looking for more robust solutions in the dedicated search space.
Proceedings ArticleDOI
Semi-empirical aging model development via accelerated aging test
TL;DR: This paper comprehensively examines the semi-empirical modelling process from test chip design to AAT experiments, which often promise more reliable results for a given technology.