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Fernando Garnacho

Researcher at Complutense University of Madrid

Publications -  26
Citations -  342

Fernando Garnacho is an academic researcher from Complutense University of Madrid. The author has contributed to research in topics: Partial discharge & Current transformer. The author has an hindex of 7, co-authored 22 publications receiving 273 citations.

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Application of HFCT and UHF Sensors in On-Line Partial Discharge Measurements for Insulation Diagnosis of High Voltage Equipment

TL;DR: This paper proposes an optimized electromagnetic detection method based on the combined use of wideband PD sensors for measurements performed in the HF and UHF frequency ranges, together with the implementation of powerful processing tools.
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Detection and Localization of Defects in Cable Sheath of Cross-Bonding Configuration by Sheath Currents

TL;DR: A new criterion for the detection and localization of defects that might occur in the cable sheath when a CB configuration is adopted is proposed, which can be applied at different levels of load current.
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Determining the test voltage factor function for the evaluation of lightning impulses with oscillations and/or an overshoot

TL;DR: In this article, the authors present a new evaluation method called test voltage function K(f) derived on the breakdown behavior of different dielectric media, that removes the standard ambiguity to determine the test voltage of an impulse with oscillations and/or an overshoot.
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Evaluation procedures for lightning impulse parameters in case of waveforms with oscillations and/or an overshoot

TL;DR: Different ways of determining mean curves of impulses with oscillations and/or overshoot are proposed and different alternatives for the definitions of overshoot amplitude and duration are suggested for impulses with overshoot.

International comparison of software for calculation of lightning impulse parameters based on a new processing algorithm

TL;DR: A new algorithm has been proposed to calculate the parameters of full lightning voltage impulses, and the application of the test voltage factor (also referred to as k-factor) is enabled.