scispace - formally typeset
G

G.E. Giudice

Researcher at Texas Tech University

Publications -  7
Citations -  57

G.E. Giudice is an academic researcher from Texas Tech University. The author has contributed to research in topics: Semiconductor laser theory & Carrier lifetime. The author has an hindex of 4, co-authored 7 publications receiving 54 citations.

Papers
More filters
Journal ArticleDOI

Single-mode operation from an external cavity controlled vertical-cavity surface-emitting laser

TL;DR: In this paper, single-mode operation from an index-guided vertical-cavity surface-emitting laser (VCSEL) has been achieved by using a fiber Bragg grating (FBG) as an external selective wavelength reflector.
Journal ArticleDOI

Differential carrier lifetime in oxide-confined vertical cavity lasers obtained from electrical impedance measurements

TL;DR: Differential carrier lifetime measurements were performed on index-guided oxide-confined vertical cavity surface emitting lasers operating at 980 nm as mentioned in this paper, with device size as a parameter, using a simple small-signal model.
Journal ArticleDOI

Measurement of differential carrier lifetime in vertical-cavity surface-emitting lasers

TL;DR: In this article, the carrier lifetimes of gain-guided proton-implanted vertical-cavity surface-emitting lasers with device size as a parameter are reported.
Journal ArticleDOI

Low-frequency noise in AlGaN-GaN doped-channel heterostructure field effect transistors grown on insulating SiC substrates

TL;DR: In this article, the authors reported low-frequency noise measurements of doped-channel AlGaN-GaN heterostructure field effect transistors grown on insulating silicon carbide substrates.
Journal ArticleDOI

Small-signal impedance characteristics of quantum-well laser structures

TL;DR: In this paper, a simple analytical expression for the frequency dependence of below-threshold small-signal impedance is derived and verified experimentally, and it is shown that the differential carrier lifetime and quantum-well transport and capture times can be extracted from electrical impedance measurements.