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Gerd Binnig

Researcher at IBM

Publications -  138
Citations -  13443

Gerd Binnig is an academic researcher from IBM. The author has contributed to research in topics: Scanning tunneling microscope & Scanning probe microscopy. The author has an hindex of 37, co-authored 137 publications receiving 13110 citations. Previous affiliations of Gerd Binnig include Delphi Automotive & Seiko Instruments.

Papers
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Journal ArticleDOI

Object-oriented image analysis for high content screening: Detailed quantification of cells and sub cellular structures with the Cellenger software

TL;DR: Detailed image analysis still is a considerable bottleneck for many cellular assays, and automated solutions to the problem are desirable, but dealing with the complexity and variability of structures in cellular images makes detailed and reliable analysis a nontrivial task.
Journal ArticleDOI

Atomic resolution with atomic force microscope

TL;DR: The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators as discussed by the authors, achieving a resolution better than 2.5 A.
Patent

Investigation and/or manipulation device

TL;DR: In this article, an investigation and/or manipulation device for a sample consisting of a material which is locally deformed when subjected to a local heat treatment is described, where the tool is movably supported by a support means, and positioning means for positioning the support means and thereby the tool relatively to the sample.

Cognition Network Technology for a Fully Automated 3D Segmentation of Liver

TL;DR: The Definiens Cognition Network Technology is applied to detect automatically tumors in a human liver and first quantitative results which are compared to manual segmentations provided by medical experts are shown.
Patent

Mechanically coupled alternatively usable cantilever structures for scanning a surface

TL;DR: In this paper, a first cantilever having a first probe and a second one having a second probe is used for scanning a surface. But the second probe does not have the ability to detect the deflection of the first one.