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Hajime Yamagishi

Researcher at Sony Broadcast & Professional Research Laboratories

Publications -  12
Citations -  1046

Hajime Yamagishi is an academic researcher from Sony Broadcast & Professional Research Laboratories. The author has contributed to research in topics: Non-volatile memory & Electrical conductor. The author has an hindex of 6, co-authored 12 publications receiving 1006 citations.

Papers
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Proceedings ArticleDOI

A novel nonvolatile memory with spin torque transfer magnetization switching: spin-ram

TL;DR: In this article, a spin torque transfer magnetization switching (STS) based nonvolatile memory called spin-RAM was presented for the first time, which is based on magnetization reversal through an interaction of a spin momentum-torque-transferred current and a magnetic moment of memory layers in magnetic tunnel junctions (MTJ).
Patent

Method of manufacturing nonvolatile memory device

TL;DR: In this article, a method of manufacturing a nonvolatile memory device having a laminated structure in which a first magnetic material layer, a tunnel insulator film, and a second magnetization material layer are sequentially laminated, in which information is stored when an electric resistance value changes depending on a magnetization reversal state is disclosed.
Proceedings ArticleDOI

A study for 0.18 /spl mu/m high-density MRAM

TL;DR: In this article, a Magnetic Tunnel Junction (MTJ) pattern was proposed to reduce the switching dispersion and improve 0/1 separation of MTJ elements in order to realize high density MRAM.
Patent

Nonvolatile magnetic memory device and photomask

TL;DR: In this paper, a plan-view shape of the recording layer of a nonvolatile magnetic memory device is described, which includes a pseudo-rhombic shape having four sides, at least two of the four sides each include a smooth curve having a central portion curved toward the center of the shape.
Patent

Solid-state imaging device, method of manufacturing solid-state imaging device, and electronic apparatus

TL;DR: In this paper, the authors proposed a solid-state imaging device that can reduce the number of steps and enhance mechanical strength, a method of manufacturing the image sensor, and an electronic apparatus, which is applicable to back-surface irradiation type CMOS image sensor.