H
Hiroshi Furukawa
Researcher at Kyushu Institute of Technology
Publications - 19
Citations - 283
Hiroshi Furukawa is an academic researcher from Kyushu Institute of Technology. The author has contributed to research in topics: Automatic test pattern generation & Test compression. The author has an hindex of 8, co-authored 19 publications receiving 282 citations.
Papers
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Proceedings ArticleDOI
VirtualScan: a new compressed scan technology for test cost reduction
Laung-Terng Wang,Xiaoqing Wen,Hiroshi Furukawa,Fei-Sheng Hsu,Shyh-Horng Lin,Sen-Wei Tsai,Khader S. Abdel-Hafez,Shianling Wu +7 more
TL;DR: The VirtualScan technology has achieved successful tape-outs of industrial chips and has been proven to be an efficient and easy-to-implement solution for scan test cost reduction.
Proceedings ArticleDOI
CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing
Hiroshi Furukawa,Xiaoqing Wen,Kohei Miyase,Yuta Yamato,Seiji Kajihara,Patrick Girard,Laung-Terng Wang,Mohammad Tehranipoor +7 more
TL;DR: CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.
Proceedings ArticleDOI
A Capture-Safe Test Generation Scheme for At-Speed Scan Testing
Xiaoqing Wen,Kohei Miyase,Seiji Kajihara,Hiroshi Furukawa,Yuta Yamato,Atsushi Takashima,Kenji Noda,H. Ito,Kazumi Hatayama,Takashi Aikyo,Kewal K. Saluja +10 more
TL;DR: This paper proposes a novel and practical capture-safe test generation scheme, featuring reliable capture-safety checking and effective capture- safety improvement by combining X-bit identification & X-filling with low launch- switching-activity test generation.
Proceedings ArticleDOI
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification
Kohei Miyase,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Yuta Yamato,Hiroshi Furukawa,Xiaoqing Wen,Seiji Kajihara +8 more
TL;DR: A novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop is proposed.
Proceedings ArticleDOI
A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing
TL;DR: A novel inter-clock at-speed test control scheme, featuring a compact and robust on-chip inter- clock enable generator design, that can generate inter-Clock at- speed test clocks from PLLs, and is feasible for both ATE-based scan testing and logic BIST.