T
Takashi Aikyo
Researcher at Fujitsu
Publications - 31
Citations - 404
Takashi Aikyo is an academic researcher from Fujitsu. The author has contributed to research in topics: Automatic test pattern generation & Fault coverage. The author has an hindex of 12, co-authored 31 publications receiving 392 citations. Previous affiliations of Takashi Aikyo include Ehime University.
Papers
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Proceedings ArticleDOI
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects
Xijiang Lin,Kun-Han Tsai,Chen Wang,M. Kassab,Janusz Rajski,Takeo Kobayashi,Randy Klingenberg,Y. Sato,S. Hamada,Takashi Aikyo +9 more
TL;DR: The experimental results show that significant test quality improvement is achieved when applying timing-aware ATPG with DSM to industrial designs.
Proceedings ArticleDOI
A Capture-Safe Test Generation Scheme for At-Speed Scan Testing
Xiaoqing Wen,Kohei Miyase,Seiji Kajihara,Hiroshi Furukawa,Yuta Yamato,Atsushi Takashima,Kenji Noda,H. Ito,Kazumi Hatayama,Takashi Aikyo,Kewal K. Saluja +10 more
TL;DR: This paper proposes a novel and practical capture-safe test generation scheme, featuring reliable capture-safety checking and effective capture- safety improvement by combining X-bit identification & X-filling with low launch- switching-activity test generation.
Proceedings ArticleDOI
Diagnostic test generation for transition faults using a stuck-at ATPG tool
Yoshinobu Higami,Yosuke Kurose,Satoshi Ohno,Hironori Yamaoka,Hiroshi Takahashi,Yoshihiro Shimizu,Takashi Aikyo,Yuzo Takamatsu +7 more
TL;DR: Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.
Proceedings ArticleDOI
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification
Kohei Miyase,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Yuta Yamato,Hiroshi Furukawa,Xiaoqing Wen,Seiji Kajihara +8 more
TL;DR: A novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop is proposed.
Proceedings ArticleDOI
Small Delay Fault Model for Intra-Gate Resistive Open Defects
Masayuki Arai,Akifumi Suto,Kazuhiko Iwasaki,Katsuyuki Nakano,Michihiro Shintani,Kazumi Hatayama,Takashi Aikyo +6 more
TL;DR: Three fault models are established considering weak resistive opens inside the gate which might cause pattern-sequence-dependent and timing-dependent malfunction of the circuit, and the proposed models have more accuracy on the detection of weak open defects.