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Hirotaka Yamaguchi

Researcher at National Institute of Advanced Industrial Science and Technology

Publications -  138
Citations -  2337

Hirotaka Yamaguchi is an academic researcher from National Institute of Advanced Industrial Science and Technology. The author has contributed to research in topics: Dislocation & Extended X-ray absorption fine structure. The author has an hindex of 22, co-authored 136 publications receiving 2180 citations. Previous affiliations of Hirotaka Yamaguchi include Electronics Research Center.

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Electrical energy storage systems for energy networks

J. Kondoh, +8 more
- 01 Nov 2000 - 
TL;DR: In this paper, the characteristics of promising energy storage systems by pumped hydro, compressed air, secondary batteries, superconducting magnet, flywheel or capacitors have been surveyed and discussed.
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Direct observation of dislocations propagated from 4H–SiC substrate to epitaxial layer by X-ray topography

Toshiyuki Ohno, +5 more
- 02 Jan 2004 - 
TL;DR: In this article, X-ray topography using synchrotron radiation was used to observe screw dislocation, threading edge dislocation and basal plane dislocation in 4H-SiC substrates and epitaxial layers.
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Temperature-Dependent Transfer Characteristics of Amorphous InGaZnO4 Thin-Film Transistors

Kazushige Takechi, +4 more
- 20 Jan 2009 - 
TL;DR: The transfer characteristics of amorphous InGaZnO4 thin-film transistors (a-IGZO TFTs) were measured at temperatures ranging from 298 to 523 K in order to analyze the behavior of the above-threshold (ON state) and subthreshold regions as mentioned in this paper.
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Comparison of Ultraviolet Photo-Field Effects between Hydrogenated Amorphous Silicon and Amorphous InGaZnO4 Thin-Film Transistors

Kazushige Takechi, +4 more
- 20 Jan 2009 - 
TL;DR: In this paper, the ultraviolet photo-field effects in amorphous InGaZnO4 thin-film transistors (a-IGZO TFTs) compared with those in hydrogenated Amorphous Si:H TFT were discussed.
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Stripe structure in the CuO2 plane of perovskite superconductors.

Antonio Bianconi, +9 more
- 01 Nov 1996 - 
TL;DR: In this paper, an anomalous long Cu-O (planar) distance, 196 \AA{, assigned to distorted strips of width W intercalated with undistorted stripes of width L, was measured by polarized Cu K-edge extended x-ray-absorption fine structure at T${\mathit{T}}_{\Mathit{c}}$