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Irina V. Sedova

Researcher at Ioffe Institute

Publications -  52
Citations -  316

Irina V. Sedova is an academic researcher from Ioffe Institute. The author has contributed to research in topics: Molecular beam epitaxy & Quantum dot. The author has an hindex of 8, co-authored 52 publications receiving 261 citations.

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Growth and excitonic properties of single fractional monolayer cdse/znse structures

TL;DR: In this article, single fractional monolayer (FM) CdSe/ZnSe structures have been grown by molecular beam epitaxy (MBE), employing both conventional MBE and migration-enhanced epitaxes (MEE).
Book ChapterDOI

Molecular beam epitaxy of wide-gap II–VI laser heterostructures

TL;DR: In this paper, the authors present a phenomenological thermodynamic model of MBE growth of II−VI compounds and alloys, which allows accurate control of their growth rate, composition, surface stoichiometry, and phase separation in wide temperature range.
Journal ArticleDOI

Molecular Beam Epitaxy of Layered Group III Metal Chalcogenides on GaAs(001) Substrates.

TL;DR: The sophisticated self-consistent analysis of X-ray diffraction, transmission electron microscopy, and Raman spectroscopy data was used to establish the correlation between growth conditions, formed polytypes and additional phases, surface morphology and crystalline structure of the III–VI 2D layers.
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Spectral selection of excitonic transitions in a dense array of CdSe/ZnSe quantum dots

TL;DR: In this article, the authors demonstrate that the selection of a limited number of single excitonic lines from a dense array of epitaxial quantum dots (QDs) can be realized spectrally via resonant energy transfer from a huge number of small QDs toward a limited set of large nano-islands through their excited levels.
Journal ArticleDOI

Exciton Bound to 1D Intersection of Stacking Fault Plane with a ZnSe Quantum Well

TL;DR: In this article, an excitonic state localized at the 1D intersection of planar stacking faults with a high quality ZnSe quantum well was observed in a specimen used for preceding transmission electron microscopy studies.