J.C. Pickel

TL;DR: In this paper, the impact of the space radiation environment on systems that contain SEE sensitive devices and the development of mitigation strategies either at the system or device level has been discussed, but as new technology has emerged, these ground test and predictive methods have certain short falls.

TL;DR: In this article, a broad-beam circuit level single-event upset (SEU) response with heavy ion microprobe charge collection measurements on single silicon-germanium heterojunction bipolar transistors improves understanding of the charge collection mechanisms responsible for SEU response.

TL;DR: In this article, a modeling approach is described for predicting charge collection in space-based infrared detector arrays due to ionizing particle radiation. The model uses a combination of analytical and Monte Carlo techniques to capture the essential features of energetic ion-induced charge collection to detector pixels in a two-dimensional array.

TL;DR: In this paper, the authors compare measurements and modeling of 27 and 63 MeV proton-induced transients in a large-format HgCdTe long wavelength infrared (LWIR) focal plane assembly operating at 40 K.

TL;DR: In this paper, measurements of proton-induced single event transients in ultra-low noise HgCdTe IR detector arrays were presented for space-based astronomy and compared to modeling results.