J
J.M. Westra
Researcher at Delft University of Technology
Publications - 5
Citations - 56
J.M. Westra is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Crystallization & Amorphous silicon. The author has an hindex of 3, co-authored 5 publications receiving 44 citations.
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Journal ArticleDOI
Formation of thin-film crystalline silicon on glass observed by in-situ XRD
TL;DR: In this paper, a-Si:H films with different hydrogen contents were annealed using temperatures ranging from 500 °C to 700 °C. Expanding thermal plasma chemical vapor deposition (ETP-CVD) was used to prepare hydrogenated aSi films; this technique was chosen because the deposition rates are much higher than with plasma enhanced CVD.
Journal ArticleDOI
Study of the effect of boron doping on the solid phase crystallisation of hydrogenated amorphous silicon films
TL;DR: In this article, B-doped a-Si:H films were used for thin-film polycrystalline silicon photovoltaics and the authors showed that the time to full crystallization can be manipulated by the B2H6-to-SiH4 ratio used during the deposition and by the microstructure of the as-deposited a-si-H films.
Proceedings ArticleDOI
Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: Relation to microstructure, defects and processing conditions
TL;DR: In this paper, a combination of Raman spectroscopy, electroluminescence imaging, cell bowing measured with a laser scanning device, confocal microscopy and ex-situ bending tests is presented.