Introduction to a Transient World. Fourier Kingdom. Discrete Revolution. Time Meets Frequency. Frames. Wavelet Zoom. Wavelet Bases. Wavelet Packet and Local Cosine Bases. An Approximation Tour. Estimations are Approximations. Transform Coding. Appendix A: Mathematical Complements. Appendix B: Software Toolboxes.

http://ahvazdownload.persiangig.com/document/article/39.pdf

A wavelet tour of signal processing

Compressive sensing is a new signal acquisition technology with the potential to reduce the number of measurements required to acquire signals that are sparse or compressible in some basis. Rather than uniformly sampling the signal, compressive sensing computes inner products with a randomized dictionary of test functions. The signal is then recovered by a convex optimization that ensures the recovered signal is both consistent with the measurements and sparse. Compressive sensing reconstruction has been shown to be robust to multi-level quantization of the measurements, in which the reconstruction algorithm is modified to recover a sparse signal consistent to the quantization measurements. In this paper we consider the limiting case of 1-bit measurements, which preserve only the sign information of the random measurements. Although it is possible to reconstruct using the classical compressive sensing approach by treating the 1-bit measurements as plusmn 1 measurement values, in this paper we reformulate the problem by treating the 1-bit measurements as sign constraints and further constraining the optimization to recover a signal on the unit sphere. Thus the sparse signal is recovered within a scaling factor. We demonstrate that this approach performs significantly better compared to the classical compressive sensing reconstruction methods, even as the signal becomes less sparse and as the number of measurements increases.

/pdf/1-bit-compressive-sensing-1pyth8ds6n.pdf

1-Bit compressive sensing

The compressive sensing (CS) framework aims to ease the burden on analog-to-digital converters (ADCs) by reducing the sampling rate required to acquire and stably recover sparse signals. Practical ADCs not only sample but also quantize each measurement to a finite number of bits; moreover, there is an inverse relationship between the achievable sampling rate and the bit depth. In this paper, we investigate an alternative CS approach that shifts the emphasis from the sampling rate to the number of bits per measurement. In particular, we explore the extreme case of 1-bit CS measurements, which capture just their sign. Our results come in two flavors. First, we consider ideal reconstruction from noiseless 1-bit measurements and provide a lower bound on the best achievable reconstruction error. We also demonstrate that i.i.d. random Gaussian matrices provide measurement mappings that, with overwhelming probability, achieve nearly optimal error decay. Next, we consider reconstruction robustness to measurement errors and noise and introduce the binary e-stable embedding property, which characterizes the robustness of the measurement process to sign changes. We show that the same class of matrices that provide almost optimal noiseless performance also enable such a robust mapping. On the practical side, we introduce the binary iterative hard thresholding algorithm for signal reconstruction from 1-bit measurements that offers state-of-the-art performance.

Robust 1-Bit Compressive Sensing via Binary Stable Embeddings of Sparse Vectors

The Compressive Sensing (CS) framework aims to ease the burden on analog-to-digital converters (ADCs) by reducing the sampling rate required to acquire and stably recover sparse signals. Practical ADCs not only sample but also quantize each measurement to a finite number of bits; moreover, there is an inverse relationship between the achievable sampling rate and the bit depth. In this paper, we investigate an alternative CS approach that shifts the emphasis from the sampling rate to the number of bits per measurement. In particular, we explore the extreme case of 1-bit CS measurements, which capture just their sign. Our results come in two flavors. First, we consider ideal reconstruction from noiseless 1-bit measurements and provide a lower bound on the best achievable reconstruction error. We also demonstrate that i.i.d. random Gaussian matrices describe measurement mappings achieving, with overwhelming probability, nearly optimal error decay. Next, we consider reconstruction robustness to measurement errors and noise and introduce the Binary $\epsilon$-Stable Embedding (B$\epsilon$SE) property, which characterizes the robustness measurement process to sign changes. We show the same class of matrices that provide almost optimal noiseless performance also enable such a robust mapping. On the practical side, we introduce the Binary Iterative Hard Thresholding (BIHT) algorithm for signal reconstruction from 1-bit measurements that offers state-of-the-art performance.

In one embodiment, an analog to digital converter (ADC) for converting an analog signal to a digital signal includes an input channel for receiving the analog signal, and includes a first and second sampling-integrating units. The first sampling-integrating unit receives the analog signal, samples the analog signal, integrates a superposition of a first feedback signal and a sampled signal of the analog signal, and generates a first output signal. The second sampling-integrating unit receives the first output signal, samples the first output signal, integrates a superposition of a second feedback signal and a sampled signal of the first output signal, and generates a second output signal. The ADC includes a feedback circuit for generating the digital signal according to the second output signal and for providing the first and second feedback signals indicative of the digital signal to the first and second sampling-integrating units respectively.

Analog to digital converters

Using sigma-delta A/D methods, high resolution can be obtained for only low to medium signal bandwidths. This article describes conventional A/D conversion, as well as its performance modeling. We then look at the technique of oversampling, which can be used to improve the resolution of classical A/D methods. We discuss how sigma-delta converters use the technique of noise shaping in addition to oversampling to allow high resolution conversion of relatively low bandwidth signals. We examine the use of sigma-delta converters to convert narrowband bandpass signals with high resolution. Several parallel sigma-delta converters, which offer the potential of extending high resolution conversion to signals with higher bandwidths, are also described.

J. vn der Spiegel

Papers

An overview of sigma-delta converters