Lanthanide-based luminescent hybrid materials.

The surface and materials science of tin oxide

Atomic layer deposition(ALD), a chemical vapor deposition technique based on sequential self-terminating gas–solid reactions, has for about four decades been applied for manufacturing conformal inorganic material layers with thickness down to the nanometer range. Despite the numerous successful applications of material growth by ALD, many physicochemical processes that control ALD growth are not yet sufficiently understood. To increase understanding of ALD processes, overviews are needed not only of the existing ALD processes and their applications, but also of the knowledge of the surface chemistry of specific ALD processes. This work aims to start the overviews on specific ALD processes by reviewing the experimental information available on the surface chemistry of the trimethylaluminum/water process. This process is generally known as a rather ideal ALD process, and plenty of information is available on its surface chemistry. This in-depth summary of the surface chemistry of one representative ALD process aims also to provide a view on the current status of understanding the surface chemistry of ALD, in general. The review starts by describing the basic characteristics of ALD, discussing the history of ALD—including the question who made the first ALD experiments—and giving an overview of the two-reactant ALD processes investigated to date. Second, the basic concepts related to the surface chemistry of ALD are described from a generic viewpoint applicable to all ALD processes based on compound reactants. This description includes physicochemical requirements for self-terminating reactions,reaction kinetics, typical chemisorption mechanisms, factors causing saturation, reasons for growth of less than a monolayer per cycle, effect of the temperature and number of cycles on the growth per cycle (GPC), and the growth mode. A comparison is made of three models available for estimating the sterically allowed value of GPC in ALD. Third, the experimental information on the surface chemistry in the trimethylaluminum/water ALD process are reviewed using the concepts developed in the second part of this review. The results are reviewed critically, with an aim to combine the information obtained in different types of investigations, such as growth experiments on flat substrates and reaction chemistry investigation on high-surface-area materials. Although the surface chemistry of the trimethylaluminum/water ALD process is rather well understood, systematic investigations of the reaction kinetics and the growth mode on different substrates are still missing. The last part of the review is devoted to discussing issues which may hamper surface chemistry investigations of ALD, such as problematic historical assumptions, nonstandard terminology, and the effect of experimental conditions on the surface chemistry of ALD. I hope that this review can help the newcomer get acquainted with the exciting and challenging field of surface chemistry of ALD and can serve as a useful guide for the specialist towards the fifth decade of ALD research.

Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

A surface science perspective on TiO2 photocatalysis

This Review focuses on recent developments in the use of ZnO nanostructures for dye-sensitized solar cell (DSC) applications. It is shown that carefully designed and fabricated nanostructured ZnO films are advantageous for use as a DSC photoelectrode as they offer larger surface areas than bulk film material, direct electron pathways, or effective light-scattering centers, and, when combined with TiO2, produce a core–shell structure that reduces the combination rate. The limitations of ZnO-based DSCs are also discussed and several possible methods are proposed so as to expand the knowledge of ZnO to TiO2, motivating further improvement in the power-conversion efficiency of DSCs.

https://depts.washington.edu/solgel/documents/pub_docs/journal_docs/2009/advanced_material2009.pdf

ZnO Nanostructures for Dye-Sensitized Solar Cells

Influence of substrate temperature on atomic layer growth and properties of HfO2 thin films

Morphology and structure of TiO2 thin films grown by atomic layer deposition

Effect of crystal structure on optical properties of TiO2 films grown by atomic layer deposition

Polycrystalline monoclinic HfO2 films were atomic layer deposited on Si(100) substrates by a nonhydrous carbon-free process of HfI4 and O2. The oxygen to hafnium ratio corresponded to the stoichiometric dioxide within the limits of accuracy of ion beam analysis. A 1.5–2.0 nm thick SiO2 interface layer formed between the HfO2 films and Si substrates. Hysteresis of the capacitance–voltage curves was observed in Al/HfO2/p-Si(100) structures with oxide grown in the substrate temperature range of 570–755 °C. The hysteresis ceased with an increase in O2 pressure. The effective permittivity of the dielectric layers varied between 12 and 16. The breakdown voltages were found to be lower in the case of higher oxygen doses and higher HfO2 deposition temperatures.

Jaan Aarik

Papers

Influence of substrate temperature on atomic layer growth and properties of HfO2 thin films

Morphology and structure of TiO2 thin films grown by atomic layer deposition

Effect of crystal structure on optical properties of TiO2 films grown by atomic layer deposition

Properties of hafnium oxide films grown by atomic layer deposition from hafnium tetraiodide and oxygen

Atomic layer deposition of titanium dioxide from TiCl4 and H2O: investigation of growth mechanism