Jannik C. Meyer

TL;DR: In this article, a comparative analysis of thermal annealing treatments in air and in vacuum, both ex situ and pre-situ, where an ultra-high vacuum treatment chamber is directly connected to an aberration-corrected scanning transmission electron microscope is presented.

TL;DR: In this paper, two different aspects of (scanning) transmission electron microscopy were studied for extended defects in graphene and hybrids of graphene with other materials, including the extraction of 3D structural information from (in first approximation) projections of the structure.

TL;DR: In this paper, a method of determining an isotope concentration in a sample (20) such as a graphene sample, is disclosed and the method comprises imaging a section of the sample with a microscope (10) using particle irradiation over a period of time, identifying a change in the image contrast due to lost atom(s) in at least one of the series of images and calculating an accumulated irradiation dose until identification of the change in contrast.

TL;DR: In this article, the authors present a characterization of low-dimensional carbon materials such as graphene or carbon nanotubes by high-resolution electron microscopy. But the characterization of carbon materials is a particular challenge due to their intrinsically low contrast and high susceptibility to radiation damage.

TL;DR: A next generation electron microscopes is currently being developed by the U.S. Department of Energy as a collaborative effort to redesign the instruments around aberration corrected optics as discussed by the authors, and the TEAM 0.5 prototype microscopes are currently being commissioned.