J
Javier Olea
Researcher at Complutense University of Madrid
Publications - 65
Citations - 1019
Javier Olea is an academic researcher from Complutense University of Madrid. The author has contributed to research in topics: Silicon & Ion implantation. The author has an hindex of 17, co-authored 59 publications receiving 864 citations. Previous affiliations of Javier Olea include Technical University of Madrid.
Papers
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Lifetime recovery in ultrahighly titanium-doped silicon for the implementation of an intermediate band material
Elisa Antolin,Antonio Martí,Javier Olea,David Pastor,Germán González-Díaz,Ignacio Mártil,Antonio Luque +6 more
TL;DR: In this paper, a recent fundamental study of the nonradiative recombination (NRR) mechanisms predicts the suppression of the NRR for ultrahigh DL dilutions as a result of the delocalization of the impurity electron wave functions.
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Titanium doped silicon layers with very high concentration
TL;DR: In this paper, the authors showed that the Ti solid solubility limit in Si has been exceeded by far without the formation of a titanium silicide layer, which is a promising result toward obtaining of an intermediate band into Si that allows the design of a new generation of high efficiency solar cell using Ti implanted Si wafers.
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Intermediate band mobility in heavily titanium-doped silicon layers
Germán González-Díaz,Javier Olea,Ignacio Mártil,David Pastor,Antonio Martí,Elisa Antolin,Antonio Luque +6 more
TL;DR: The sheet resistance and Hall mobility of high-purity Si wafers, in whose surface Ti atoms are implanted and laser annealed reaching concentrations above 10(21) cm(-3), are measured in the 90-370 K range as mentioned in this paper.
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Sub-bandgap absorption in Ti implanted Si over the Mott limit
TL;DR: In this article, structural and optical properties of Si implanted with very high Ti doses and subsequently pulsed-laser melted (PLM) were analyzed, and all samples exhibit an abrupt and roughly uniform, box-shaped Ti profile, with a concentration around 2'×'1020 cm−3, within a 150 nm thick layer.
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High quality Ti-implanted Si layers above the Mott limit
Javier Olea,Maria Toledano-Luque,David Pastor,E. San-Andres,Ignacio Mártil,Germán González-Díaz +5 more
TL;DR: In this paper, a detailed characterization of high quality layers of Si implanted with Ti at high doses is presented, which are intended to the formation of an intermediate band (IB) solar cell.