J
Jicheng Cui
Researcher at Chinese Academy of Sciences
Publications - 24
Citations - 174
Jicheng Cui is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Grating & Spectrometer. The author has an hindex of 6, co-authored 23 publications receiving 135 citations.
Papers
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Journal ArticleDOI
Real-time monitoring of ruling grating resolution by digital wavefront
TL;DR: In this paper, the authors provided a method based on Rayleigh criterion with a designing optical measurement structure to measure yaw and displacement errors of a grating ruling machine feeding system.
Journal ArticleDOI
An improved accuracy-measuring method in manufacturing the lead screw of grating ruling engine
Xuefeng Yao,Jicheng Cui,Yu Haili,Xiangdong Qi,Mi Xiaotao,Yimin Jiang,Wang Mingjia,Xiaotian Li +7 more
TL;DR: In this article, the axial displacement of the screw shaft was measured using a laser interferometer, and results showed that the variation amplitude of screw-shaft axial displacements was about 80 nm while the variation period was consistent with the rotation period of screw shaft.
Journal ArticleDOI
Establishment and correction of an Echelle cross-prism spectrogram reduction model
TL;DR: In this article, the spectral model of an echelle cross-prism spectrometer was calibrated using least squares principle and element lamps with known characteristic wavelength to obtain the actual values of the system parameters.
Patent
Optical path structure of small echelle grating spectrometer
TL;DR: In this article, an optical path structure of a small echelle grating spectrometer was proposed, which consists of a condenser lens, an incident pinhole, a collimating lens and a cylindrical lens.
Journal ArticleDOI
Method for measurement of eccentricity and tilt of lenslet array integral field spectrometer.
Jianan Liu,Jianjun Chen,Jianli Liu,Shulong Feng,Jin Yang,Song Nan,Ci Sun,Jicheng Cui,Bayanheshig +8 more
TL;DR: Use of this method to detect eccentricity and tilt and assist in adjustment of the system allows the instrument to achieve higher accuracy and thus obtain improved imaging quality and spectral resolution.