J
Jin He
Researcher at Wuhan University
Publications - 455
Citations - 4612
Jin He is an academic researcher from Wuhan University. The author has contributed to research in topics: MOSFET & Field-effect transistor. The author has an hindex of 26, co-authored 415 publications receiving 3695 citations. Previous affiliations of Jin He include Nanyang Technological University & Nantong University.
Papers
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Journal ArticleDOI
Sex-specific differences in sleep-disordered breathing and nocturnal hypoxemia in chronic thromboembolic pulmonary hypertension and chronic thromboembolic pulmonary disease
Huiting Li,Ping Yuan,Qin-Hua Zhao,Su-Gang Gong,Hong Jiang,Jinling Li,Hong Ting Liu,Hong-Ling Qiu,Wen-Hui Wu,Ci-Jun Luo,Jin He,Lan Wang,Jinming Liu +12 more
TL;DR: Sex-specific nocturnal hypoxemia was present in patients with CTEPH or CTEPD, and in female patients, the HSI showed high capacity for predicting the risk ofCTEPH.
Proceedings ArticleDOI
A physics based analytical model of undoped body MOSFETs
TL;DR: In this paper, a continuous physics based analytic model of undoped (or lightly doped) body MOSFETs has been derived by incorporating the solution of the Poisson equation into Pao-Sah integrated current equation using SPP approach.
Numerical study on gate-All-Around tunneling FET with SiO2 core and Si shell structure
TL;DR: In this paper, a gate-all-around tunneling FET based on SiO2 core and Si shell structure (GAA-SOI-TFET) is presented.
Comparison and insight into long-channel MOSFET drain current models
TL;DR: The error of the traditional charge sheet models in predicting the drain current compared with Pao-Sah’s dual integral model is demonstrated and the reason that Brews’ charge sheet model fails to pass the self consistency tests reported previously is provided.
Proceedings ArticleDOI
Numerical Simulation on the Voltage Response of Field Effect Transistor by Focused Terahertz Radiation
TL;DR: In this paper, a numerical method is proposed to simulate the corresponding terahertz photoresponse which is induced by radiations between source and gate and gate-and-drain electrodes in field effect transistors.