J
Jin-Wook Lee
Researcher at Samsung
Publications - 167
Citations - 1581
Jin-Wook Lee is an academic researcher from Samsung. The author has contributed to research in topics: Terminal (electronics) & Flash memory. The author has an hindex of 19, co-authored 155 publications receiving 1544 citations.
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Patent
Integrated circuit device and method of manufacturing the same
TL;DR: In this article, the authors proposed a method for providing a plurality of active regions on a substrate, and at least a first device isolation layer between two of the plurality of the active regions, where each of the first gate line and second gate line crossing at least one active region.
Journal ArticleDOI
A dual-mode NAND flash memory: 1-Gb multilevel and high-performance 512-Mb single-level modes
Cho Tae-Hee,Yeong-Taek Lee,Eun-cheol Kim,Jin-Wook Lee,Sun-Mi Choi,Seung-jae Lee,Dong-Hwan Kim,Wook-Ghee Hwasung Han,Young-Ho Lim,Jae-Duk Lee,Jung-Dal Choi,Kang-Deog Suh +11 more
TL;DR: A 116.7-mm/sup 2/ NAND flash memory having two modes, 1-Gb multilevel program cell (MLC) and high-performance 512-Mb single-level program Cell (SLC) modes, is fabricated with a 0.15-/spl mu/m CMOS technology, achieving 1.6 and 6.9 MB/s program throughputs for MLC and SLC modes.
Proceedings ArticleDOI
A 3.3 V 1 Gb multi-level NAND flash memory with non-uniform threshold voltage distribution
Cho Tae-Hee,Young-Taek Lee,Eun-cheol Kim,Jin-Wook Lee,Sun-Mi Choi,Seung-jae Lee,Dong-Hwan Kim,Wook-Kee Han,Young-Ho Lim,Jae-Duk Lee,Jung-Dal Choi,Kang-Deog Suh +11 more
TL;DR: A 1 Gb NAND flash memory with 2b per cell uses 0.15 /spl mu/m CMOS and achieves simultaneous operation of 4 independent banks with 1.6 GMB/s program throughput.
Patent
Method and system for managing objects in a display environment
TL;DR: In this article, a system for managing an object base on a criterion in a display environment, including a condition analysis unit which selects the object having metadata information corresponding to condition information of the criterion, is presented.
Patent
Flash memory device capable of improving reliability
Jin-Wook Lee,Jin-Yub Lee +1 more
TL;DR: In this paper, a flash memory device includes a memory cell array having a first region and a second region that include memory cells arranged in a plurality of rows and columns; an address storage circuit adapted to store address information for defining the second region; a row decoder and a control logic adapted to control the voltage generating circuit in response to an output of the detecting circuit during read operation.