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Jing Wei

Researcher at Chinese Academy of Sciences

Publications -  64
Citations -  507

Jing Wei is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Welding & Laser beam welding. The author has an hindex of 12, co-authored 61 publications receiving 395 citations. Previous affiliations of Jing Wei include Jiujiang University.

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Effects of macroscopic graphite particulates on the damping behavior of commercially pure aluminum

TL;DR: In this article, the effect of macroscopic graphite (Gr) particulates on the damping behavior of commercially pure aluminum (Al) was investigated by using a multifunction internal friction apparatus (MFIFA), and the internal friction was measured at frequencies of 0.5, 1.0 and 3.0 Hz over the temperature range of 25-400°C.
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Progress of the ITER Correction Coils in China

TL;DR: The ITER Correction Coils (CC) as mentioned in this paper are three sets of six coils each, distributed symmetrically around the tokamak to correct error fields, each pair of coils is series connected with polarity to produce asymmetric fields.
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Evaluation of inter-granular corrosion susceptibility in 316LN austenitic stainless steel weldments

TL;DR: In this paper, the intergranular corrosion resistance of 316LN austenitic stainless steel welding joints for an ITER Correction Coil case in the as-welded and post weld heat treatment (PWHT) condition were systematically investigated.
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Microstructure and mechanical properties of ultra-narrow gap laser weld joint of 100 mm-thick SUS304 steel plates

TL;DR: A defect-free welded joint of 100 mm-thick SUS 304 steel plates is produced by ultra-narrow gap laser welding with filler wire in the laser conduction mode in 42 layers as discussed by the authors.
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Low-frequency damping behavior of foamed commercially pure aluminum

TL;DR: In this paper, the damping behavior of foamed commercially pure aluminum (FA) was investigated using pressure infiltration process and microstructural analysis was performed using transmission electron microscopy (TEM).