J
Joachim Mayer
Researcher at RWTH Aachen University
Publications - 467
Citations - 10601
Joachim Mayer is an academic researcher from RWTH Aachen University. The author has contributed to research in topics: Microstructure & Thin film. The author has an hindex of 49, co-authored 429 publications receiving 9071 citations. Previous affiliations of Joachim Mayer include McMaster University & Max Planck Society.
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Multistep Sulfur Leaching for the Development of a Highly Efficient and Stable NiSx/Ni(OH)2/NiOOH Electrocatalyst for Anion Exchange Membrane Water Electrolysis
TL;DR: In this paper , a Ni-rich NiSx/Ni(OH)2/NiOOH catalyst derived from NiS 2/Ni3S4 nanocubes was developed for anion exchange membrane water electrolysis.
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Metallurgical analysis and RF losses in superconducting niobium thin film cavities
D. Bloess,C. Durand,E. Mahner,H. Nakai,Wolfgang Weingarten,P. Bosland,Joachim Mayer,L. Van Loyen +7 more
TL;DR: In this paper, the dependence on the RF frequency is studied by exciting 500 MHz and 1500 MHz cavities in different modes, and the microstructural characterization in plan-view allows the extraction of the grain size and the defect densities.
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Exploring the detection limits of infrared near-field microscopy regarding small buried structures and pushing them by exploiting superlens-related effects.
TL;DR: The depth-limitation for the visibility of gold nanoparticles with a diameter of 50 nm under Si3N4 is determined to about 50 nm and the explanation combines subsurface imaging and superlensing, and shows up limitations of the latter regarding small structure sizes.
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Electron-Diffraction Study on an Amorphous Al-V Alloy Produced by Electron Irradiation of Quasicrystalline Al-16 at-%V
TL;DR: In this article, the phase quasicristalline Al-16%atV is transformee a l'etat amorphe apres irradiation electronique a basse temperature dans un microscope electronique, a haute tension.
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Resonant and phonon-assisted tunneling transport through silicon quantum dots embedded in SiO2
B. Berghoff,Stephan Suckow,R. Rölver,Bernd Spangenberg,Heinrich Kurz,Arbi Dimyati,Joachim Mayer +6 more
TL;DR: In this article, the authors investigated low temperature I-I-V measurements of SiO2 matrix and found that the I-V characteristics are correlated with the morphology of Si QDs extracted from transmission electron microscopy and photoluminescence.