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Joachim Schulz

Researcher at European XFEL

Publications -  169
Citations -  8823

Joachim Schulz is an academic researcher from European XFEL. The author has contributed to research in topics: Laser & LIGA. The author has an hindex of 41, co-authored 158 publications receiving 8048 citations. Previous affiliations of Joachim Schulz include University of Oulu & University of Hamburg.

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Patent

X-ray lithography mask composed of nickel or a nickel base alloy

TL;DR: In this paper, an X-ray lithography mask comprising a frame and a membrane clamped thereon is proposed, wherein the membrane consists of nickel or a nickel base alloy and is provided at least partly with an absorber layer.
Journal ArticleDOI

Double Grating Interferometry in a Commercial Micro Computed Tomography System for Biomedical Imaging

TL;DR: X-ray double grating interferometer (XDGI) is a phase contrast imaging technique that provides high contrast, local electron densities, and can be translated to laboratory and medical settings.
Patent

Gitter aus mindestens zwei materialien für die röntgenbildgebung

TL;DR: Gitter zur Analyse des Interferenzbildes in Interferometern fur die Rontgentomographie mittels Phasenkontrastmethoden umfassend einen Trager und Gitterstege aus mindestens zwei verschiedene Materialien, Verfahren zu deren Herstellung und deren Verwendung.