J
Jr-Jian Ke
Researcher at King Abdullah University of Science and Technology
Publications - 13
Citations - 395
Jr-Jian Ke is an academic researcher from King Abdullah University of Science and Technology. The author has contributed to research in topics: Resistive random-access memory & Single crystal. The author has an hindex of 9, co-authored 13 publications receiving 321 citations. Previous affiliations of Jr-Jian Ke include National Taiwan University.
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Surface effects on optical and electrical properties of ZnO nanostructures
TL;DR: A comprehensive review of the surface effects on physical properties and potential applications of nanostructured ZnO is presented in this paper, with personal perspectives on a few surfacerelated issues that remain to be addressed.
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Charge carrier injection and transport engineering in two-dimensional transition metal dichalcogenides
TL;DR: This review intertwines current engineering strategies tailoring the carrier injection and carrier transport of two-dimensional transition metal dichalcogenides toward efficient electronic devices.
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Surface effect on resistive switching behaviors of ZnO
TL;DR: In this paper, the surface effect-induced conductivity lowering due to O2(ad)− chemisorption leads to increased resistance of high resistance state (HRS).
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Fast-Response, Highly Air-Stable, and Water-Resistant Organic Photodetectors Based on a Single-Crystal Pt Complex
Dharmaraj Periyanagounder,Tzu Chiao Wei,Ting-You Li,Ting-You Li,Chun-Ho Lin,Théo P. Gonçalves,Hui-Chun Fu,Dung-Sheng Tsai,Jr-Jian Ke,Hung‐Wei Kuo,Kuo-Wei Huang,Norman Lu,Xiaosheng Fang,Jr-Hau He,Jr-Hau He +14 more
TL;DR: These findings strongly support and promote the use of the single-crystal Pt complex (1o) in next-generation organic optoelectronic devices.
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Development of Ohmic nanocontacts via surface modification for nanowire-based electronic and optoelectronic devices: ZnO nanowires as an example
TL;DR: This scheme includes Ga ion surface modification and direct-write Pt deposition induced by Ga ion, leading to an Ohmic nanocontact with a specific contact resistance as low as 2.5 × 10(-6)Ω cm(2).