J
Jun Hong Noh
Researcher at Korea University
Publications - 156
Citations - 40045
Jun Hong Noh is an academic researcher from Korea University. The author has contributed to research in topics: Perovskite (structure) & Thin film. The author has an hindex of 45, co-authored 140 publications receiving 34395 citations. Previous affiliations of Jun Hong Noh include Seoul National University & Los Alamos National Laboratory.
Papers
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Efficient n-i-p Monolithic Perovskite/Silicon Tandem Solar Cells with Tin Oxide via a Chemical Bath Deposition Method
TL;DR: In this paper, the authors applied low-temperature processed tin oxide via chemical bath deposition (CBD) to a homojunction silicon solar cell without additional deposition of a recombination layer.
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Oxide/Halide/Oxide Architecture for High Performance Semi‐Transparent Perovskite Solar Cells
TL;DR: In this paper , a NiOx-based semi-transparent perovskite solar cells (PSCs) with a hole transporting layer and buffer layer is proposed to avoid sputtering damage during deposition of transparent conducting oxide.
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Electrical and optical properties of epitaxial and polycrystalline undoped and Al-doped ZnO thin films grown by pulsed laser deposition
TL;DR: In this paper, undoped and al-doped (1.6%) ZnO films were prepared on (0001) sapphire and fused silica substrates using a pulsed laser deposition technique.
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Synthesis of carbon-incorporated titanium oxide nanocrystals by pulsed solution plasma: electrical, optical investigation and nanocrystals analysis
Chan Woo Lee,Seok-Geun Lee,Jun Hong Noh,Hyun Suk Jung,Kyoung-Jae Chung,Kug Sun Hong,Dong Wook Kim,Yong-Seok Hwang,Dong Wan Kim +8 more
TL;DR: In this paper, the discharge characteristics of the plasma were investigated via the resistance of the plasminar channel from current and voltage profiles as a function of capacitor energy, and the formation mechanism of the product was discussed through optical emission spectroscopy.
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Seed-layer mediated orientation evolution in dielectric Bi-Zn-Ti-Nb-O thin films
Jin Young Kim,Jun Hong Noh,Sangwook Lee,Sung Hun Yoon,Chin Moo Cho,Kug Sun Hong,Hyun Suk Jung,Jung-Kun Lee +7 more
TL;DR: In this paper, high-resolution transmission electron microscopy supported that the interfacial layer consists of Bi and Pt. The preferred orientation was ascribed to the interlayer layer, the lattice parameter of which is similar to BZTN.