J
Jürgen H. Werner
Researcher at University of Stuttgart
Publications - 345
Citations - 12335
Jürgen H. Werner is an academic researcher from University of Stuttgart. The author has contributed to research in topics: Silicon & Solar cell. The author has an hindex of 57, co-authored 342 publications receiving 11646 citations. Previous affiliations of Jürgen H. Werner include IBM & Max Planck Society.
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Journal ArticleDOI
Universal Passivation for p++ and n++ Areas on IBC Solar Cells
Kai Carstens,Morris Dahlinger,E. Hoffmann,Jürgen Köhler,Renate Zapf-Gottwick,Jürgen H. Werner +5 more
TL;DR: In this article, a universal passivation for both, phosphorus and boron doped surfaces of interdigitated back contact solar cells is presented. And the amorphous silicon layer enables saturation current densities J o,em = 46 fA/cm 2 for laser doped p ++ borón emitters with sheet resistance R sh,m = 90Ω/sq as well as J o o,bsf = 73 fA /cm2 for laser Doped n ++ phosphorus back surface fields with R sh,bsf °=°36°�
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Germanium vertical Tunneling Field-Effect Transistor
D. Hahnel,Michael Oehme,M. Sarlija,A. Karmous,M. Schmid,Jürgen H. Werner,O. Kirfel,Inga A. Fischer,Jörg Schulze +8 more
TL;DR: The first realization of a pure Germanium bulk vertical Tunneling Field Effect Transistor (vTFET) and a high Ion/Ioff ratio for a pure Silicon bulk vTFET are both reported in this paper.
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Molecular beam epitaxy grown Ge/Si pin layer sequence for photonic devices
TL;DR: In this article, the optoelectronic performances of a pin diode made from a Ge/Si heterostructure pin layer sequence grown by molecular beam epitaxy are discussed, and it is shown that depending on the chosen operating point and device design, the diode serves as a broadband high speed photo detector, Franz-Keldysh effect modulator or light emitting diode.
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Antimony doped Si Esaki diodes without post growth annealing
TL;DR: In this article, the authors investigated the influence of the boron surface segregation effects on the peak current density of silicon Esaki diodes, and found good peak to valley current ratios in excess of 3 and excellent peak current densities up to 5.2
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Pulsed Laser Porosification of Silicon Thin Films.
TL;DR: A new and simple laser-based process to porosify thin film silicon using a pulsed laser to tailor the pore size between 50 and 550 nm by changing laser pulse energy density and film deposition parameters is presented.