J
Jürgen Oehm
Researcher at Ruhr University Bochum
Publications - 62
Citations - 435
Jürgen Oehm is an academic researcher from Ruhr University Bochum. The author has contributed to research in topics: CMOS & Voltage. The author has an hindex of 11, co-authored 61 publications receiving 410 citations. Previous affiliations of Jürgen Oehm include Technical University of Dortmund & Infineon Technologies.
Papers
More filters
Journal ArticleDOI
A low-IF RX two-point /spl Sigma//spl Delta/-modulation TX CMOS single-chip Bluetooth solution
C. Durdodt,Martin Friedrich,Christian Grewing,Markus Hammes,Andre Hanke,Stefan Heinen,Jürgen Oehm,Duyen Pham-Stäbner,Dietolf Seippel,Detlev Theil,S. van Waasen,Elmar Wagner +11 more
TL;DR: In this article, a low-cost concept for a system-on-chip Bluetooth solution is proposed, which includes all necessary baseband and RF parts to achieve full Bluetooth functionality and is implemented in a standard 0.25/spl mu/m CMOS technology.
Journal ArticleDOI
Quality assurance and upgrade of analog characteristics by fast mismatch analysis option in network analysis environment
Jürgen Oehm,K. Schumacher +1 more
TL;DR: In this article, the usefulness and power of fast mismatch analysis options within the network analysis environment are demonstrated, and simulated yield statistics and measurements of a fabricated analog application are reported and compared.
Journal ArticleDOI
A Hardware-Based Countermeasure to Reduce Side-Channel Leakage: Design, Implementation, and Evaluation
TL;DR: An improved decoupling circuit which reduces the crosstalk from the internal to the external power supply and a novel circuit concept, which decouples the main power supply from an internal power supply that is used to drive a single logic gate.
Proceedings Article
Quality assurance and upgrade of analog characteristics by fast mismatch analysis option in network analysis environment
Jürgen Oehm,K. Schumacher +1 more
TL;DR: The usefulness and power of fast mismatch analysis options within the network analysis environment are demonstrated and the physical connections introduced between local and global process variations lead to new procedures for calculating the overall tolerance ranges of the electrical characteristics.
Patent
Tunable capacitive component, and LC oscillator with the component
Jürgen Oehm,Duyen Pham-Stäbner +1 more
TL;DR: In this article, a tunable, capacitive component that includes a pair of MOS transistors whose gate connections are connected via a respective coupling capacitance to the pair of circuit nodes between which the tuned capacitance can be tapped off.