K. Ertl

TL;DR: In this paper, surface and sub-surface morphology and deuterium retention in polycrystalline tungsten, undamaged and pre-damaged with 5.5 MeV W2+ ions to damage levels of 0.04, 0.4, and 1.2

TL;DR: In this article, thin films of Be deposited on W, the inverse system (W films on Be), as well as experiments where W surfaces are exposed to a Be-seeded deuterium plasma are presented.

TL;DR: In this paper, the depth profiles of D atoms and D2 molecules in a W single crystal implanted with 6 keV D ions at 300 K were determined using secondary ion mass spectrometry (SIMS) and residual gas analysis (RGA).

TL;DR: In this article, the depth profiles of D atoms and D2 molecules in W single crystals and hot-rolled W implanted with 6 keV D ions at 300 and 650 K were determined by means of secondary ion mass spectrometry (SIMS) and residual gas analysis (RGA) measurements in the course of surface sputtering.

TL;DR: In this article, the deuterium (D) ion implantation and retention at room temperature was studied in pure and carbon (C) implanted tungsten single crystals and the range distributions were investigated in situ using 1 MeV 3 He ions analysing the energy distributions of α particles from the D ( 3 He, p ) α reaction while the total amount of retained D was obtained from the p-integral.