K
K. Radhakrishnan
Researcher at Nanyang Technological University
Publications - 233
Citations - 1875
K. Radhakrishnan is an academic researcher from Nanyang Technological University. The author has contributed to research in topics: Molecular beam epitaxy & Photoluminescence. The author has an hindex of 20, co-authored 198 publications receiving 1640 citations. Previous affiliations of K. Radhakrishnan include Sri Venkateswara College of Engineering & University of Illinois at Urbana–Champaign.
Papers
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Titanium doped cupric oxide for photovoltaic application
Saeid Masudy-Panah,Saeid Masudy-Panah,K. Radhakrishnan,Hui Ru Tan,Ren Yi,Ten It Wong,Goutam Kumar Dalapati +6 more
TL;DR: The potential of titanium incorporation into cupric oxide (CuO) is demonstrated in this paper, where it is shown that Ti doped CuO reduces sheet resistance and improved the charge transport properties.
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Grey scale structures formation in SU-8 with e-beam and UV
TL;DR: In this article, an experimental study of the possibility to fabricate grey scale optical elements and 3D structures in SU-8 resist was carried out, and a new technology for 3D self-supporting structure formation was suggested for applications in microfluidics and bioscience.
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Reactive sputter deposition and characterization of tantalum nitride thin films
TL;DR: In this paper, electrical and structural properties of tantalum nitride films, deposited on GaAs substrates by a d.c. magnetron sputtering technique at different nitrogen partial pressures for use as resistors in integrated circuits, have been reported.
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p‐CuO/n‐Si heterojunction solar cells with high open circuit voltage and photocurrent through interfacial engineering
Saeid Masudy-Panah,Saeid Masudy-Panah,Goutam Kumar Dalapati,K. Radhakrishnan,Akash Kumar,Akash Kumar,Hui Ru Tan,Elumalai Naveen Kumar,Elumalai Naveen Kumar,Chellappan Vijila,Cheng Cheh Tan,Dongzhi Chi +11 more
TL;DR: In this paper, the interface properties and crystal quality of sputter-deposited CuO thin film were investigated using high-resolution transmission electron microscopy analysis and X-ray diffraction.
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Electrical and electrochemical characterization of Li2O:P2O5:Nb2O5-based solid electrolytes
TL;DR: In this paper, an extended glass forming region has been identified in the Li2O:P2O 5:Nb2O5 system, where a high ionic conductivity value ≅2 × 10 −6 Ω −1 cm −1 at room temperature has been found for the composition 60Li 2O:30P 2O5:10Nb 2O 5.