K
K. Ramesh
Researcher at Indian Institute of Technology Madras
Publications - 128
Citations - 2168
K. Ramesh is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Photoelasticity & Stress intensity factor. The author has an hindex of 23, co-authored 125 publications receiving 1884 citations. Previous affiliations of K. Ramesh include Indian Institute of Technology Bombay & Indian Institutes of Technology.
Papers
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Journal ArticleDOI
Development of photoelastic fringe plotting scheme from 3D FE results
P. R. D. Karthick Babu,K. Ramesh +1 more
TL;DR: In this article, a novel approach to plot photoelastic fringe contours from 3D finite element results is presented, which uses a scanning approach and the evaluation of total fringe order is achieved by combining a file structure and subsequent sorting of these data to enable integration along the light path.
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New initiatives in single-colour image-based fringe order estimation in digital photoelasticity:
TL;DR: The use of single-colour image for determining the fringe orders in digital photoelasticity has gained importance in recent years, and in this, the fringe order are obtained by comparing the colou
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Evaluation of Conformal and Non-Conformal Contact Parameters Using Digital Photoelasticity
TL;DR: In this article, the explicit equations recently reported in the literature for a flat punch with rounded edges are generalized so that a single set of equations can be used for Hertzian contacts with arbitrary radii of curvatures, and the generality of the governing equations is verified by plotting isochromatics for conformal and non-conformal contact situations.
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An adaptive scanning scheme for effective whole field stress separation in digital photoelasticity
K. Ashokan,K. Ramesh +1 more
TL;DR: An adaptive scanning scheme is proposed so that stress separation can be carried out even if there is only one free boundary pixel available in the model.
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Scanning schemes in white light Photoelasticity – Part I: Critical assessment of existing schemes
Vivek Ramakrishnan,K. Ramesh +1 more
TL;DR: The existing scanning schemes are critically evaluated for their ability to scan the entire model domain, influence of seed point selection and noise propagate, which makes them suitable especially for problems where recording multiple images is difficult.