L
L. Tsau
Researcher at Broadcom
Publications - 1
Citations - 17
L. Tsau is an academic researcher from Broadcom. The author has contributed to research in topics: Sensitivity (control systems). The author has an hindex of 1, co-authored 1 publications receiving 4 citations.
Papers
More filters
Proceedings ArticleDOI
Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET
TL;DR: In this article, SRAM SER measurements across technology nodes indicate that while scaling from planar processes down to the 7-nm FinFET process provided a reduction in the per-bit SER at every node, subsequent scaling to the 5-nm fin-fet process results in an increase in the SER relative to the 6-nm process.