L
Laurent Henn-Lecordier
Researcher at University of Maryland, College Park
Publications - 24
Citations - 740
Laurent Henn-Lecordier is an academic researcher from University of Maryland, College Park. The author has contributed to research in topics: Atomic layer deposition & Chemical vapor deposition. The author has an hindex of 11, co-authored 24 publications receiving 699 citations.
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Journal ArticleDOI
Nanotubular metal–insulator–metal capacitor arrays for energy storage
Parag Banerjee,Israel Perez,Laurent Henn-Lecordier,Sang Bok Lee,Sang Bok Lee,Gary W. Rubloff +5 more
TL;DR: The use of atomic layer deposition is reported to be used to fabricate arrays of metal-insulator-metal nanocapacitors in anodic aluminium oxide nanopores that have a capacitance per unit planar area significantly exceeding previously reported values.
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TEM-Based Metrology for HfO2 Layers and Nanotubes Formed in Anodic Aluminum Oxide Nanopore Structures
Israel Perez,Erin Robertson,Parag Banerjee,Laurent Henn-Lecordier,Sang Jun Son,Sang Bok Lee,Gary W. Rubloff +6 more
TL;DR: The TEM analysis technique provides a method for the rapid analysis of such nanostructures in general, and is also a means to efficiently quantify ALD profiles in nanostructureures for a variety of nanodevice applications.
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Atomic Layer Deposition of Ruthenium Using the Novel Precursor bis(2,6,6-trimethyl-cyclohexadienyl)ruthenium
TL;DR: In this paper, a bis(2,6,6-trimethyl-cyclohexadienyl)ruthenium was developed and characterized as a precursor for atomic layer deposition (ALD) of ruthensium.
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Development of a spatially controllable chemical vapor deposition reactor with combinatorial processing capabilities
TL;DR: In this article, a three-zone, segmented showerhead-based CVD reactor system is proposed to control the spatial profile of gas-phase chemical composition across the wafer surface.
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Real-time sensing and metrology for atomic layer deposition processes and manufacturing
TL;DR: In situ quadrupole mass spectrometry (QMS) has been integrated to an atomic layer deposition (ALD) reactor to achieve real-time chemical diagnostic and wafer-state metrology.