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Lukas M. Eng

Researcher at Dresden University of Technology

Publications -  296
Citations -  7689

Lukas M. Eng is an academic researcher from Dresden University of Technology. The author has contributed to research in topics: Ferroelectricity & Piezoresponse force microscopy. The author has an hindex of 42, co-authored 268 publications receiving 6467 citations. Previous affiliations of Lukas M. Eng include Helmholtz-Zentrum Dresden-Rossendorf.

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Optical three-dimensional profiling of charged domain walls in ferroelectrics by Cherenkov second-harmonic generation

TL;DR: Cherenkov second-harmonic generation (CSHG) is a powerful tool for three-dimensional domain wall profiling in ferroic bulk crystals as discussed by the authors, which can be applied for tracking head-to-head charged domain walls (CDWs) across millimeter-thick ferroelectric single-crystalline lithium niobate.
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Enhancing the Domain Wall Conductivity in Lithium Niobate Single Crystals

TL;DR: This work reports on an easy-to-use and reliable protocol that allows enhancing domain wall conductivity (DWC) in single-crystalline LNO (sc-LNO) by 3 to 4 orders of magnitude.
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Distance dependent spectral tuning of two coupled metal nanoparticles.

TL;DR: A periodic modulation of the coupled plasmon resonance is observed for separations smaller than 1.5 microm and this interparticle coupling affects the scattering cross section in terms of spectral position and spectral width as well as the integral intensity of the Mie-scattered light.
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Near-field coupling of a single fluorescent molecule and a spherical gold nanoparticle

TL;DR: Near-field coupling of a single gold nanoparticle (GNP) to a single fluorescent molecule is investigated here for varying separation d and a pronounced near-field enhancement is observed under certain conditions, partly outweighing the efficiency loss at small distances.
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Anisotropy contrast in phonon-enhanced apertureless near-field microscopy using a free-electron laser.

TL;DR: The imaging of ferroelectric domains in BaTiO3 is demonstrated using an infrared-emitting free-electron laser as a tunable optical source for scattering scanning near-field optical microscopy and spectroscopy, showing that the orientation of the dielectric tensor with respect to the sample surface has a clear influence on the near- field signal.