L
Lynn Schneemeyer
Researcher at Alcatel-Lucent
Publications - 181
Citations - 9753
Lynn Schneemeyer is an academic researcher from Alcatel-Lucent. The author has contributed to research in topics: Superconductivity & Charge density wave. The author has an hindex of 50, co-authored 181 publications receiving 9571 citations. Previous affiliations of Lynn Schneemeyer include Agere Systems & Bell Labs.
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Journal ArticleDOI
Thermally activated dissipation in Bi2.2Sr2Ca0.8Cu2O8+δ
TL;DR: In this paper, a new dissipation behavior is reported in superconducting Bi2.2Sr2Ca0.8Cu2Oa+δ for all temperatures below Tc and all magnetic fields exceeding Hc1.
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Dissipative flux motion in high-temperature superconductors
TL;DR: The dissipation below {ital T}{sub {ital c}} has been studied for representatives of all classes of cuprate high-temperature superconductors, including Ba{sub 2}YCu{sub 3}O{sub 7{minus}{delta}}, and Bi and Tl compounds.
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Structure and physical properties of single crystals of the 84-K superconductor Bi 2.2 Sr 2 Ca 0.8 Cu 2 O 8+δ
Steven A. Sunshine,Theo Siegrist,Lynn Schneemeyer,Donald W. Murphy,Robert J. Cava,Bertram Batlogg,R. B. van Dover,R. M. Fleming,S. H. Glarum,S. Nakahara,Reginald C. Farrow,J. J. Krajewski,S. M. Zahurak,Joseph V. Waszczak,J. H. Marshall,P. Marsh,L. W. Rupp,W. F. Peck +17 more
TL;DR: La structure a des plans [CuO 2 ] ∞ separes par des atomes de calcium, des couches doubles d'oxyde de bismuth and a un niveau incommensurable le long de b avec une periode de 4,76
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Superconductivity near 70 K in a new family of layered copper oxides
Robert J. Cava,Bertram Batlogg,J. J. Krajewski,L. W. Rupp,Lynn Schneemeyer,Theo Siegrist,R. B. vanDover,P. Marsh,W. F. Peck,P. K. Gallagher,S. H. Glarum,J. H. Marshall,Reginald C. Farrow,Joseph V. Waszczak,Robert Hull,P. L. Trevor +15 more
TL;DR: In this article, a new family of high-temperature superconductors with the general formula Pb2Sr2ACu3O8+δ is described.
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Discovery of a useful thin-film dielectric using a composition-spread approach
TL;DR: In this article, a composition spread technique was used to evaluate thin-film dielectrics with high dielectric constant and high breakdown field for the Zr 0.15Sn0.3Ti0.55O2−δ system.