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M

M. D. Jack

Researcher at Raytheon

Publications -  7
Citations -  252

M. D. Jack is an academic researcher from Raytheon. The author has contributed to research in topics: Molecular beam epitaxy & Avalanche photodiode. The author has an hindex of 6, co-authored 7 publications receiving 242 citations.

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Journal ArticleDOI

Electrical and optical properties of infrared photodiodes using the InAs/Ga1−xInxSb superlattice in heterojunctions with GaSb

TL;DR: In this article, the InAs/Ga1−xInxSb strained-layer superlattice (SLS) holds promise as an alternative III-V semiconductor system for long wavelength infrared detectors.
Proceedings ArticleDOI

Ultra-High sensitivity APD based 3D LADAR sensors: linear mode photon counting LADAR camera for the Ultra-Sensitive Detector program

TL;DR: In this article, the authors present an update of this development work: the basic amplifier and APD component performance, the front end architecture, the demonstration of single photon detection using a simple 4 × 4 SCA and the design and evaluation of critical components of a fully integrated photon counting camera under development in support of the Ultra-Sensitive Detector (USD) program sponsored by AFRL-Kirtland.
Journal ArticleDOI

MBE growth of HgCdTe avalanche photodiode structures for low-noise 1.55 μm photodetection

TL;DR: In this paper, the authors used molecular-beam epitaxy to fabricate HgCdTe heterostructure separate absorption and multiplication avalanche photodiodes (SAM-APD) sensitive to infrared radiation in the 1.1-1.6 μm spectral range, as an alternative technology to existing III-V APD detectors.
Journal ArticleDOI

MBE-grown HgCdTe multi-layer heterojunction structures for high speed low-noise 1.3-1.6 mm avalanche photodetectors

TL;DR: In this paper, an all molecular beam epitaxially grown HgCdTe multi-layer heterojunction structure on CdZnTe substrates was presented for backside illumination.
Journal ArticleDOI

HgCdTe composition determination using spectroscopic ellipsometry during molecular beam epitaxy growth of near-infrared avalanche photodiode device structures

TL;DR: In this paper, the application of spectroscopic ellipsometry (SE) for real-time composition determination during molecular beam epitaxy (MBE) growth of HgCdTe alloys with x > 0.5 is reported.