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Mahesh V. Panchagnula

Researcher at Indian Institute of Technology Madras

Publications -  79
Citations -  1274

Mahesh V. Panchagnula is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Contact angle & Drop (liquid). The author has an hindex of 16, co-authored 76 publications receiving 1126 citations. Previous affiliations of Mahesh V. Panchagnula include Purdue University & National University of Singapore.

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Spatial droplet velocity and size profiles in effervescent atomizer-produced sprays

TL;DR: In this article, the number averaged droplet velocity profiles, Sauter mean diameter (SMD) profiles, and size-velocity correlations were analyzed for rotary kiln incinerators.
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Is the Cassie-Baxter formula relevant?

TL;DR: Experimental and numerical data for advancing and receding contact angles are reported and it is shown that deviations from the Cassie-Baxter angle have a one-to-one correlation with microscopic distortions of the contact line with respect to its configuration in the CassIE-B Baxter state.
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Constitutive modeling of contact angle hysteresis.

TL;DR: A phase field model of wetting of surfaces by sessile drops that uses a two-dimensional non-conserved phase field variable to parametrize the Gibbs free energy of the three-dimensional system and is used to study heterogeneous surfaces whose component surfaces are themselves hysteretic.
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On synthesizing solid polyelectrolyte microspheres from evaporating liquid marbles.

TL;DR: Measurements of the rate of mass loss during evaporation are presented to demonstrate evidence of two limiting physical processes, and the estimated values of the water diffusion coefficients are compared with the values reported in the literature to demonstrate good agreement.
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Phase field modeling of hysteresis in sessile drops.

TL;DR: A novel approach to describe wetting of plane solid surfaces by liquid drops is proposed and significant departure from the classical Cassie theory is shown, which is attributed to defect pinning of the continuous triple line.