M
Malle Krunks
Researcher at Tallinn University of Technology
Publications - 155
Citations - 4246
Malle Krunks is an academic researcher from Tallinn University of Technology. The author has contributed to research in topics: Thin film & Nanorod. The author has an hindex of 34, co-authored 145 publications receiving 3712 citations. Previous affiliations of Malle Krunks include Helsinki University of Technology.
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Zinc oxide thin films by the spray pyrolysis method
Malle Krunks,Enn Mellikov +1 more
TL;DR: In this article, it was shown that the main factors determining the parameters of ZnO films are the growth temperature and the indium concentration, and that the growth temperatures of 625-675 K, indium doping levels of 1-1.5 at% and precursor concentrations of 0.1-0.2 mol 1−1 are preferable to achieve ZnOs with optical and structural qualities as required for solar cell applications.
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Nanostructured solar cell based on spray pyrolysis deposited ZnO nanorod array
TL;DR: In this article, an extremely thin absorber (ETA) layer solar cell was realized by the chemical spray pyrolysis method, where a CuInS2 absorber was deposited onto a blocking layer coated ZnO nanorods grown on a transparent conductive oxide.
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Synthesis, vibrational spectra and X-ray structures of copper(I) thiourea complexes
TL;DR: In this article, the structures of six copper-thiourea complexes were determined at room and also at low temperature, and the stochastic ratio of the resulting thin film was shown to be 1:3.
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Structural and electrical characterization of TiO2 films grown by spray pyrolysis
TL;DR: In this article, the authors used sol-gel spray pyrolysis to grow TiO 2 thin films onto silicon wafers at substrate temperatures between 315 and 500 °C using pulsed spray solution feed followed by annealing in the temperature interval from 500 to 800 °C in air.
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Crystal quality studies of CuInS2 films prepared by spray pyrolysis
TL;DR: In this article, the phase composition and crystal quality of copper indium sulfide (CIS) films grown by spray pyrolysis were determined using Raman spectroscopy and XRD methods.