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Masashi Ishii

Researcher at National Institute for Materials Science

Publications -  60
Citations -  564

Masashi Ishii is an academic researcher from National Institute for Materials Science. The author has contributed to research in topics: Photoluminescence & Luminescence. The author has an hindex of 11, co-authored 56 publications receiving 527 citations. Previous affiliations of Masashi Ishii include University of Manchester.

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Local structure analysis of an optically active center in Er-doped ZnO thin film

TL;DR: The local structure of an optically active center in erbium-doped zinc oxide (ZnO:Er) thin film produced by a laser ablation technique and its optical activation process are investigated by Er LIII-edge x-ray absorption fine structure analysis using a synchrotron radiation as an x-Ray source as mentioned in this paper.
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The optically active center and its activation process in Er-doped Si thin film produced by laser ablation

TL;DR: In this article, the local structure of erbium-doped silicon produced by the laser ablation technique is investigated by Er LIII-edge x-ray absorption fine structure analysis.
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Study on atomic coordination around Er doped into anatase– and rutile– TiO2: Er–O clustering dependent on the host crystal phase

TL;DR: In this article, an x-ray absorption fine structure analysis of the atomic coordination around Er revealed the dynamics of Er-O clustering in anatase (A−) or rutile (R−)TiO2.
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Static states and dynamic behaviour of charges: observation and control by scanning probe microscopy

TL;DR: In the data-writing process, spatially dispersive charges rather than a fast injection rate are introduced, but the technical problems can be solved by using nanostructures.
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Site-selective x-ray absorption fine structure analysis of an optically active center in Er-doped semiconductor thin film using x-ray-excited optical luminescence

TL;DR: In this paper, a site-selective x-ray absorption fine structure (XAFS) analysis using xray-excited optical luminescence was performed to discuss the local structure of an optically active center in Er-doped Si thin film, and a broad 2p-5d resonant peak was reproduced by a density-ofstate calculation of a distorted ErO6 cluster, assuming an Er transformation from an octahedral center of 0.25 A.