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Masayuki Kamei

Researcher at University of Tokyo

Publications -  62
Citations -  957

Masayuki Kamei is an academic researcher from University of Tokyo. The author has contributed to research in topics: Thin film & Substrate (electronics). The author has an hindex of 13, co-authored 62 publications receiving 935 citations. Previous affiliations of Masayuki Kamei include Asahi Glass Co. & Center for Advanced Materials.

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Origin of characteristic grain-subgrain structure of tin-doped indium oxide films

TL;DR: In this paper, the microstructures of polycrystalline and heteroepitaxial tin-doped indium oxide (ITO) thin films prepared by sputtering and electron beam (EB) evaporation were investigated by electron microscopy, X-ray diffraction and reflection high-energy electron diffraction.
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Electrical and Structural Properties of Tin-Doped Indium Oxide Films Deposited by DC Sputtering at Room Temperature

TL;DR: In this article, a hard sphere collision model was used to evaluate the crystallinity and electrical properties of indium oxide (ITO) films, which showed a clear dependence on target-substrate distance (T-S) and total gas pressure (Ptot) during deposition.
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Hydrophobic drawings on hydrophilic surfaces of single crystalline titanium dioxide : surface wettability control by mechanochemical treatment

TL;DR: In this paper, a position-controlled high-speed hydrophilic to hydrophobic transition was achieved on single crystalline anatase-TiO 2 (001) surfaces applying a new "wet rubbing" method.
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Preparation and Crystallization of Tin-doped and Undoped Amorphous Indium Oxide Films Deposited by Sputtering

TL;DR: In this article, the structural and electrical properties of amorphous tin-doped indium oxide (a-ITO) films were investigated by X-ray diffraction and Hall effect measurements.
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Electrical properties of heteroepitaxial grown tin‐doped indium oxide films

TL;DR: In this article, a thin-film tin-doped indium oxide (ITO) was heteroepitaxially grown on optically polished (100) or (111) planes of single-crystalline yttria-stabilized zirconia (YSZ) substrates using e−beam evaporation or dc magnetron sputtering techniques.