M
Meyya Meyyappan
Researcher at Ames Research Center
Publications - 259
Citations - 19525
Meyya Meyyappan is an academic researcher from Ames Research Center. The author has contributed to research in topics: Carbon nanotube & Nanowire. The author has an hindex of 65, co-authored 253 publications receiving 17911 citations. Previous affiliations of Meyya Meyyappan include Division of IT Convergence Engineering & PARC.
Papers
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Journal ArticleDOI
High Density Array Matrices of Polymeric Structures by Ultrathin Interfacial Layer-Mediated Double Replication Approach
TL;DR: In this paper, the authors demonstrate rapid, efficient and reliable fabrication and replication of high density arrays of polymeric structures using ultrathin layer-mediated processes, achieving submicrometer to nanometer radius-of-curvatures and consistent vertical profiles.
Proceedings Article
Nanotechnology : Role in emerging nanoelectronics
B. Yu,Meyya Meyyappan +1 more
TL;DR: In this article, the potential successors of the silicon CMOS technology at the end of the ITRS Roadmap (in ∼15 years) are discussed, rooted in nanoscale science, in several mainstream applications such as computing and data storage.
Proceedings ArticleDOI
Carbon nanotube scanning probe for surface profiling of DUV and 193-nm photoresist pattern
Cattien V. Nguyen,Ramsey M. Stevens,Jabulani Barber,Jie Han,Meyya Meyyappan,Martha I. Sanchez,Carl E. Larson,William D. Hinsberg +7 more
TL;DR: In this article, the use of an atomic force microscope coupled with high aspect ratio multi-walled carbon nanotube scanning probe tip for the purpose of imaging surface profile of photoresists was reported.
Journal ArticleDOI
A nanowire-based shift register for display scan drivers
TL;DR: A transparent nanowire-based shift register that functions as the standard logic circuit of a display scan driver is reported that produced an output of 0-3 V without an output voltage drop while applying an input of 3 V peak to peak.
Proceedings ArticleDOI
Single Event Hard Error due to Terrestrial Radiation
TL;DR: In this article, the authors present that the terrestrial radiation-induced single event can potentially result in hard-error, and that hard error hardening might be necessary in the near future even in consumer electronics.